Oxford Instruments in Bangladesh

Vvon Technologies Limited supplies, installs and services Oxford Instruments equipment across Bangladesh. 96 products are catalogued across Nanotechnology.

Categories

• Instrument Software (26)
• Electron Microscopy & Microanalysis (15)
• Photoluminescence & Time-Resolved Spectroscopy (13)
• Plasma Etching & Deposition (12)
• Atomic Force & Scanning Probe Microscopy (11)
• X-Ray Sources & Tubes (10)
• Raman Spectroscopy (6)
• Accessories & Modules (3)

Products

• Ultim Max Infinity: Ultim Max Infinity is the Oxford Instruments silicon drift detector range for energy dispersive X-ray analysis in the SEM. Sensor sizes from 40 to 170 square millimetres all give the same analytical performance, with a motorised slide for insertion and retraction.
• Ultim Extreme Infinity: Ultim Extreme Infinity is a windowless energy dispersive X-ray detector for ultra high resolution field emission SEM. Its shaped sensor sits close to the sample at very short working distance, so elemental analysis can be run at the low kV used for nanomaterials and surfaces.
• Xplore: Xplore is a compact energy dispersive X-ray detector for routine microanalysis in the SEM. It uses the same X4 electronics as the larger Ultim Max Infinity detectors in a smaller package, with motorised insertion and extra cooling removed to reduce parts and allow in field repair.
• XploreCompact for TTM: XploreCompact is an energy dispersive X-ray detector sized to fit inside the outer casing of a table top microscope with no cut outs. It carries the same detector technology as the larger Ultim Max range, bringing AZtecLive real time chemical imaging to benchtop SEMs.
• Unity: Unity is a combined backscattered electron and X-ray detector for the SEM. Both sensor types sit in one package directly beneath the pole piece, which raises X-ray sensitivity and removes the shadowing that affects conventional detectors on rough and unpolished samples.
• Symmetry S3: Symmetry S3 is an all in one electron backscatter diffraction detector built on a CMOS sensor with lens free fibre optic coupling. It combines high indexing speed with the sensitivity needed for low energy and low current work, and the detector tilt is controlled from software.
• C-Nano+: C-Nano+ is an entry level electron backscatter diffraction detector using a customised CMOS sensor. Its high pixel resolution suits detailed strain analysis, and the lens free fibre optic design gives the sensitivity needed for beam sensitive and nanocrystalline materials.
• C-Swift+: C-Swift+ is a high speed entry level electron backscatter diffraction detector for routine materials analysis and high throughput characterisation. It uses a customised CMOS sensor with fibre optics, and can trade speed for pattern quality on complex multi phase samples.
• OmniProbe: OmniProbe nanomanipulators are used for lift out work in FIB and SEM systems, mainly TEM lamella preparation. The ninth generation units run on piezoelectric motors under closed loop control, and the port mounted design keeps clear of other detectors and accessories.
• OmniProbe 350 Cryo lift-out: The cryo lift out option extends OmniProbe lift out to cryogenic samples, including those made by high pressure freezing. A custom probe shaft with a thermally isolated tip is cooled passively from the cryo system cold finger, opening up cryo-TEM and cryo atom probe work.
• Horizon 10k Ion Polisher: The Horizon 10k Ion Polisher uses an argon plasma to etch and prepare flat and cross sectional samples for microscopy. A cooling stage limits thermal damage, and recipe based operation with simple sample mounting keeps preparation repeatable on soft and difficult materials.
• OmniProbe 400: Now in its ninth generation, this nanomanipulator applies piezo actuation to nanoscale positioning in the FIB and SEM, offering four degrees of freedom in X, Y, Z and R with 4 mm or more of working distance. Nanometre-resolution piezo actuators paired with 10 nm closed-loop encoders deliver precision, linearity and smooth motion, and closed loop control lets the operator navigate to stored positions and move orthogonally at any sample tilt. Motorised concentric rotation and in situ tip changes come as standard, so probe needles can be swapped in under 3 minutes without venting the microscope. Insertion and retraction are non-pneumatic, which is gentle on fragile samples.
• Ultim Max TLE: Ultim Max TLE is the Oxford Instruments flagship silicon drift detector for the TEM, optimised for elemental characterisation at the atomic scale with maximum count rates at the smallest probe sizes. Its performance comes from an optimised sensor shape, a 100 mm2 sensor, windowless construction, an optimised mechanical design and Extreme electronics. The detector is also aimed at biological sample analysis, where it collects data quickly and accurately on beam sensitive samples by maximising the count rate of low energy X-rays. Extreme electronics combined with the X4 pulse processor allow in situ EDS mapping and quantification at elevated temperatures.
• Ultim Max TEM: Ultim Max TEM is the Oxford Instruments silicon drift detector for nanoscale analysis and elemental mapping in the TEM. A low profile 80 mm2 sensor sits closer to the specimen and so collects more X-ray counts under any condition, and combined with windowless construction and Extreme electronics it delivers high performance EDS for 200kV instruments. An increased solid angle and take off angle reduce shadowing by bulky in situ holders, which supports mapping of samples in gas or liquid cells.
• Xplore TEM: Xplore TEM is the Oxford Instruments silicon drift detector aimed at routine work on 120kV and 200kV transmission electron microscopes. It combines an 80 mm2 sensor with a polymer thin window and Extreme electronics for fast, accurate elemental characterisation. The SATW window keeps the detector straightforward to use, and element coverage runs from beryllium to californium.
• iXon EMCCD Cameras for Microscopy & Life Science: Andor's iXon platform is a dedicated ultrasensitive EMCCD camera family engineered to draw the best from electron multiplying CCD technology across every critical performance parameter. Two sensor formats are offered, the 1024 x 1024 iXon 888 for field of view, sensitivity and speed, and the 512 x 512 iXon 897 for sensitivity and speed, each available in Ultra and Life platforms. iXon Ultra adds a conventional CCD amplifier, integrated shutter, CameraLink direct data access, single photon counting modes and cooling to -100 °C, while iXon Life is aimed exclusively at fluorescence microscopy with cooling to -80 °C. Both platforms are compatible with SRRF-Stream + real time super-resolution, which typically improves resolution by 2 to 6 fold, giving 50-150nm final resolution.
• iKon Slow-Scan Large CCD Cameras: The iKon slow scan CCD series applies thermoelectric cooling to -100 °C for very low noise, with back-illuminated photon collection across a broad spectral range and wide dynamic range. Its low maintenance design suits long exposure, low light work in astronomy and weak luminescence detection, and it is robust enough for remote observatories. A Fast Kinetics mode can also capture bursts of data with microsecond dynamics for quantum gas absorption experiments. Two models are offered, the 2048 x 2048 iKon-L 936 and the 1024 x 1024 iKon-M 934, with standard silicon and deep depletion sensor options for enhanced near infrared response.
• sCMOS Camera Series: Scientific CMOS brings together a set of performance characteristics that Andor describes as a breakthrough for high fidelity, quantitative scientific measurement. Large field of view and high resolution come from multi-megapixel sensors, and none of that costs read noise, dynamic range or frame rate. Five platforms make up the series, among them two workhorse models: ZL41 Cell for life science researchers and ZL41 Wave for physical science researchers.
• Intensified CCD and sCMOS Cameras: Andor's intensified camera series draws on CCD and sCMOS sensors together with gated image intensifier technology, combining rapid acquisition rates with ultra-high sensitivity down to single photon. Four platforms are offered: the iStar 320T for high resolution, nanosecond scale time-resolved spectroscopy, the 1024 x 1024 iStar 334T for time-resolved imaging, the high resolution iStar 340T for spectroscopy, and the USB 3.0 iStar sCMOS. Andor states the iStar sCMOS reaches frame rates at least 50% faster than competing CCD or interline platforms at equivalent pixel matrix size, while keeping intrinsically low noise.
• iDus Spectroscopy Cameras: iDus is Andor's compact spectroscopy detector line for low photon flux measurement with large dynamic range, covering the ultraviolet to near infrared with CCD models and the short wave infrared with InGaAs models. The CCD variants are published in 1024 x 128, 1024 x 256 and 2000 x 256 formats with 26 or 15 µm pixels, 95% peak QE and cooling to -100 °C with UltraVac. Two InGaAs versions extend coverage, the iDus InGaAs-1.7 across 1 to 1.7 µm and the iDus InGaAs-2.2 across 1.7 to 2.2 µm, both in 512 x 1 and 1024 x 1 formats with 25 or 50 µm pixels and cooling to -90 °C. Andor lists the current CCD models as iDus 401, iDus 416 and iDus 420.
• Newton CCD and EMCCD Cameras: Newton is Andor's spectroscopy detector platform for fast spectral rates and multi-fibre acquisition, offered as a CCD for low ultraviolet to near infrared photon flux and as an EMCCD for very low visible photon flux. The CCD version comes in 1024 x 256 and 2048 x 512 formats with 26 or 13.5 µm pixels, reaching 1,612 spectra per second, while the EMCCD version uses 1600 x 200 and 1600 x 400 formats with 16 µm pixels and reaches 1,515 spectra per second. Both cool to -100 °C with UltraVac and reach 95% peak quantum efficiency. A fast kinetics mode with microsecond resolution is available for broadband spectra.
• CCD, sCMOS & EMCCD Cameras for X-ray and EUV: Andor groups its high energy detection cameras into a single portfolio spanning CCD, sCMOS and EMCCD sensors for table-top laboratory and beamline experiments. The range serves extreme ultraviolet, X-ray, neutron and electron detection in material science, plasma studies, bio-sample analysis and beam or source characterisation. Three coupling approaches are covered: open front direct detection with UltraVac, fibre optic coupled indirect detection, and lens coupled indirect detection. The newest platform is the Marana-X back-illuminated sCMOS for direct X-ray detection.
• NIR SWIR Cameras: Andor's C-RED series gathers InGaAs based cameras built for quantitative scientific measurement in the NIR II and SWIR imaging window. High sensitivity is matched to high speed and wide dynamic range across a wide field of view, so both fast processes and slow ones running to several minutes of exposure can be captured. Three models make up the family: the C-RED 2 for high speed low noise work, the compact temperature stabilised C-RED 2 Lite, and the C-RED 2 ER extended range versions reaching 1.9 µm and 2.2 µm.
• Kymera 193i Spectrograph: Designed around research-grade performance, versatility and ease of use, the Kymera 193i uses intelligent motorised adaptive focusing to reach the best spectral resolution in any configuration with high repeatability. Its 193 mm focal length and F/3.6 aperture, paired with Andor's ultra-sensitive UV-NIR and SWIR detectors, give strong photon collection efficiency for low light micro-fluorescence and Raman work as well as routine spectral acquisition. An indexed dual-grating turret with eXpressID RFID recognition, dual detector outputs and an astigmatism-corrected toroidal optical design make the platform highly configurable. Dedicated micro-spectroscopy interfaces, including a modular cage system, allow direct integration with microscopes.
• Kymera 328i Spectrograph: The Kymera 328i is a highly modular third-metre spectrograph with patented Adaptive Focus, a quadruple on-axis grating turret and TruRes technology for enhanced spectral resolution. Its motorised Adaptive Focus automatically reaches the best optical performance for any grating, camera or wavelength range, while TruRes delivers resolution gains exceeding 30% without changing grating or applying mathematical post-processing. The 328 mm focal length and F/4.1 aperture cover luminescence and photoluminescence spectroscopy through to higher resolution Raman and plasma studies. A robust on-axis wavelength drive gives single-grating and grating-to-grating centre wavelength repeatability down to 4 and 10 pm respectively.
• Shamrock 500i Spectrograph: Built on a Czerny-Turner optical design, the Shamrock 500i imaging spectrometer is optimised for multi-track spectroscopy. It is supplied pre-aligned and pre-calibrated as a camera and spectrometer detection solution so it drops into an existing set-up, with a spectroscopy-dedicated software interface giving real time control of detectors and spectrometer together. Optimised toroidal optics correct image astigmatism for high density multi-track work, and the motorised indexed triple grating turret can be upgraded in the field.
• Shamrock 750 Spectrograph: The Shamrock 750 offers the highest resolution in the Shamrock family and also handles multi-track work well. Its rugged Czerny-Turner platform is supported by a wide range of light coupling accessories and gratings, and pairs with Andor's CCD, electron multiplying CCD, InGaAs and intensified CCD cameras. Systems are supplied pre-aligned and factory calibrated, and Solis spectroscopy software provides a single interface for spectrograph, detector and motorised accessory control. A multi-track enhanced option optimises the system for low crosstalk, high density multi-leg fibre signal acquisition.
• Mechelle 5000 Spectrograph: The Mechelle ME5000 echelle spectrograph records a wide wavelength range from 200 to 975 nm simultaneously in a single acquisition. It has no moving components and is available in a pre-aligned detector and spectrometer format, with a patented optical design based on the echelle grating principle that gives extremely low crosstalk and high resolution. Automatic temperature correction compensates for the change in prism refractive index with temperature, and nitrogen purging maximises throughput in the ultraviolet. Andor Solis software extracts a fully wavelength calibrated spectrum from the complex echelle image and can label peaks against the NIST table.
• Atomfab: Atomfab is a plasma enhanced atomic layer deposition system built for volume production of GaN power and RF devices. A remote plasma source designed for atomic scale processing gives low damage passivation and gate dielectric films, with clusterable automated wafer handling.
• PlasmaPro ASP: PlasmaPro ASP is a remote plasma enhanced ALD system sharing the Atomfab platform. It deposits conformal oxides and nitrides across 200 mm wafers at high rate, using a low volume chamber for rapid gas exchange and a biased electrode for tuning film properties.
• PlasmaPro 100 ALE: The PlasmaPro 100 ALE applies a cyclical, digital etch process for precise depth control on nanoscale layers. Built on the Cobra ICP platform, it removes material with low damage and smooth surfaces for GaN HEMT recess etching and 2D material patterning.
• PlasmaPro 100 ALE with Etchpoint: This configuration pairs the PlasmaPro 100 ALE with the Etchpoint UV reflectance etch depth monitor developed with LayTec. It measures remaining AlGaN thickness during processing, so p-GaN HEMT and recessed gate MISHEMT structures can be etched to a set depth.
• PlasmaPro 100 Cobra ICP RIE: The PlasmaPro 100 Cobra ICP RIE uses a high density inductively coupled plasma for fast etch rates with independent control of substrate bias. It handles wafers up to 200 mm and serves GaAs and InP optoelectronics, microLEDs, SiC and GaN power devices and MEMS.
• PlasmaPro 100 Cobra GaAs VCSEL: A PlasmaPro 100 Cobra configuration set up for volume VCSEL manufacture. The process gives a clean mesa sidewall finish, controlled profile angle for critical dimension control and very low footing, working with either photoresist or a hard mask.
• PlasmaPro 100 RIE: The PlasmaPro 100 RIE delivers isotropic and anisotropic dry etching across a wide process range. A single RF plasma source sets both ion density and energy, with load lock and cassette to cassette options for repeatable research and production work up to 200 mm.
• PlasmaPro 100 Estrelas DRIE: The PlasmaPro 100 Estrelas creates deep, steep sided trenches and vias in silicon. It runs both Bosch and cryogenic processes in the same chamber, covering high rate cavity etches, high aspect ratio features and tapered vias for MEMS and advanced packaging.
• PlasmaPro 100 PECVD: The PlasmaPro 100 PECVD deposits dielectric and silicon based films with control of refractive index, stress, electrical properties and wet chemical etch rate. Dual frequency power applied to the showerhead electrode allows stress control and film densification.
• PlasmaPro 100 ICPCVD: The PlasmaPro 100 ICPCVD uses a high density remote plasma to grow dielectric films at low temperature with little substrate damage. Typical materials include silicon dioxide, silicon nitride, silicon oxynitride, silicon and silicon carbide on wafers up to 200 mm.
• PlasmaPro 100 Nano CVD: The PlasmaPro 100 Nano, formerly Nanofab, is a high temperature CVD and PECVD system for growing 1D and 2D nanomaterials and heterostructures. A cold wall chamber with showerhead delivery supports graphene, hBN, transition metal dichalcogenide and nanotube growth.
• Ionfab: Ionfab systems perform ion beam etching, milling and ion beam deposition in a single chamber, with beam energy and ion flux controlled independently. Platen tilt sets the sidewall profile, and handling options run from open load to cassette to cassette.
• Cypher S: Asylum Research's ultra high performance research AFM, built on the small, stiff Cypher scanner. Published deflection noise sits below 15 pm and scanning runs up to 40 times faster than conventional instruments. The full range of electrical, mechanical and functional imaging modes is available, which suits work on 2D materials and on piezoelectric and ferroelectric samples.
• Cypher ES: Oxford Instruments describe the Cypher ES as the first AFM engineered specifically for exceptional environmental control. A fully sealed sample chamber sits at its centre, with modular options for operation in controlled gases or in liquid, sample heating and cooling, humidity control and electrochemistry. It shares the Cypher platform with the Cypher S, Cypher L and Cypher VRS1250.
• Cypher L: The most accessible entry point into the Cypher platform, giving high resolution core imaging from the start. Oxford Instruments publish an upgrade path from the Cypher L to the more advanced Cypher models, so a laboratory can begin with core imaging and extend the instrument as the work grows.
• Cypher VRS1250: Oxford Instruments publish the Cypher VRS1250 as the first and only full featured video rate AFM. Images are captured at up to 45 frames per second while the versatility of the Cypher platform is retained.
• Vero S Interferometric AFM: The standard ambient configuration of Asylum Research's next generation Vero AFMs. Rather than inferring motion from cantilever angle, the Vero measures true tip displacement using Quadrature Phase Differential Interferometry, or QPDI. The Vero platform was named a 2024 R&D 100 award winner.
• Vero ES Interferometric AFM: The environmental control configuration of the Vero AFM line, measuring true tip displacement by Quadrature Phase Differential Interferometry (QPDI). Detection noise falls by up to ten times on many cantilevers and imaging runs 10 to 100 times faster than typical AFMs. Sample temperature options cover 0 to 250 C where heating alone is needed, or 0 to 120 C where both heating and cooling are required.
• Vero VRS1250 Interferometric AFM: This model carries all three of Asylum Research's most advanced AFM technologies at once: Quadrature Phase Differential Interferometry (QPDI), video rate speed imaging and blueDrive photothermal excitation. Line rates reach 1250 lines per second and imaging reaches 45 frames per second. Detection noise is cut by up to ten times or more on many cantilevers.
• Jupiter Discovery AFM: A large sample research AFM that pairs best in class performance with a workflow built for everyday use. Ultra high resolution is held at scan rates 5 to 20 times faster than other AFMs. Pre-mounted probes, a side view camera and the exclusive FFM Topography imaging mode with Autopilot cut the setup work before a measurement, and the system is configurable across a wide range of research needs.
• MFP-3D Origin AFM: The entry level member of the MFP-3D family, marking where Asylum Research performance and quality meet an accessible specification. XY scan range is 120 um with 15 um of Z travel, and a 40 um Z range is available as an option. Large samples, most imaging modes and many of the family accessories are supported, and samples can be heated to 275 C.
• MFP-3D Origin+ AFM: The more capable member of the MFP-3D family, described by Oxford Instruments as an extremely versatile and high performance research AFM ready for almost any field of research. Published scan range is 120 um in XY with 15 um in Z, and a 40 um Z range is available as an option.
• MFP-3D-BIO AFM: The MFP-3D built for bioscience, integrating AFM with optical microscopy on an inverted stand without compromising imaging resolution, force measurement performance or application versatility. Z range is 15 um as standard with a 40 um extended option, and deflection noise is typically below 8 pm against a guaranteed figure below 20 pm. It runs alongside brightfield, phase contrast, epifluorescence, confocal, TIRF, FRET, FCS and FRAP optical techniques.
• witec360 Raman Imaging Microscope: Oxford Instruments publish the witec360 as the new benchmark for Raman imaging and correlative microscopy, aimed at academic and industrial researchers who need comprehensive analysis at the nanoscale. The core system is broadband from 350 to 1100 nm, with options extending from 266 nm in the UV to 1064 nm in the NIR, and spectral resolution reaches 0.1 cm-1 at 633 nm excitation. Lateral resolution is below 300 nm and depth resolution below 950 nm depending on excitation wavelength, with acquisition below 1 ms per spectrum. Spectrometers are offered at 300 mm or 600 mm focal length carrying up to six gratings, the objective turret holds up to six objectives, and sample positioning travel ranges run from 25 mm by 25 mm to 350 mm by 300 mm.
• witec360 access Entry-level Raman Microscope: A micro-Raman microscope for single spot analysis and mapping, engineered by Oxford Instruments for budget conscious customers who still hold high demands on instrument performance. It is built to be upgraded, so a laboratory can start at entry level and extend the system later.
• witec360 Semiconductor Edition: A high end confocal Raman and photoluminescence microscope configured specifically for chemical imaging of semiconducting materials. Wafers up to 12 inch, that is 300 mm, are handled on a 300 by 350 mm scanning stage, and peak shifts below 0.01 cm-1 can be detected. Vibration damping, TrueSurface active focus stabilisation and fully automated microscope control are included, and various laser wavelengths are available.
• cryoRaman Cryogenic Raman Imaging Microscope: The performance and modularity of the witec360 Raman microscopes combined with advanced cryostat and nanopositioner technology, which puts experiments down to 1.8 K in high magnetic fields within easy reach. Solenoid magnets up to 12 T are available, as are vector magnets, using low vibration closed cycle attoDRY cryostats. Excitation runs from the visible to the NIR through cryogenic compatible high numerical aperture objectives, with polarisation control on both excitation and detection, and options for time correlated single photon counting and low wavenumber Raman detection.
• RISE Raman-SEM Microscope: Published by Oxford Instruments as the world's first fully integrated Raman imaging and scanning electron microscope, bringing every feature of a stand-alone SEM and of the confocal witec360 Raman microscope into one instrument. Switching between the Raman and SEM measurement positions is quick and the sample transfer between them is automated, so results correlate and images overlay directly. Diffraction limited lateral resolution is 200 to 300 nm, three dimensional images and depth profiles are supported, and an ultra-fast Raman imaging option brings integration time down to 0.76 ms per spectrum. A RISE-EDS configuration adds Raman-SEM-EDS in the same instrument.
• alphaCART Mobile Raman System: A mobile confocal Raman system for the applications where the laboratory has to travel to the sample. The Raman probe is positioned flexibly in front of bulky, immovable or precious objects that cannot be transported to a microscope or that will not fit under one. The system ships in a flight case of roughly 100 by 60 by 60 cm, covers about 90 to 3500 cm-1 depending on excitation wavelength, and is offered with 532 nm, 633 nm or 785 nm lasers at output powers from 30 mW to more than 200 mW. Spatial resolution is diffraction limited and the system runs under Microsoft Windows 11.
• CMOS EBSD IR Screen: The CMOS EBSD IR Screen lets electron backscatter diffraction run during in situ heating experiments. It blocks the infrared radiation emitted by a hot sample that would otherwise saturate the detector, without the loss of sensitivity caused by coating the phosphor screen.
• EDS IR Filter: The EDS IR Filter allows energy dispersive X-ray analysis during in situ heating in the SEM. It uses a light material to block infrared radiation from the hot sample while still passing low energy X-rays, and is fitted only for heating work so room temperature analysis is unaffected.
• CMOS NA-TKD Screen: The Near Axis Transmission Kikuchi Diffraction screen is an angled screen positioned close to the axis of the transmitted beam. Used with the Oxford Instruments CMOS EBSD detectors it raises sensitivity, allowing lower probe current and better spatial resolution.
• AZtec Suite 6.3: AZtec Suite 6.3 is the current release of the Oxford Instruments acquisition and processing platform for EDS, EBSD, BEX and RISE systems. It adds batch export and HTML reporting, a RISE navigator, magic wand area selection, new AutoPhaseMap and further detector safety.
• AZtecLiveOne: AZtecLiveOne is a simplified energy dispersive X-ray software platform for users without detailed training in the technique. It is aimed at multi user laboratories where operators need dependable results quickly and can be brought up to speed in minutes.
• AZtecOne: AZtecOne is a complete energy dispersive X-ray system pairing the AZtecOne software with the Xplore detector. It is built for laboratories that need straightforward elemental analysis without substantial operator training, and suits shared multi user instruments.
• AZtecHKL: AZtecHKL is the Oxford Instruments electron backscatter diffraction acquisition software. It carries out data collection and analysis in real time, drives the Symmetry S3 detector, and is set up for nanoscale orientation mapping by transmission Kikuchi diffraction.
• AZtecCrystal 4.0: AZtecCrystal 4.0 is the Oxford Instruments electron backscatter diffraction data processing package, first released in 2019 and developed since for high speed detectors. It adds dislocation analysis, parent grain reconstruction and MapSweeper pattern matching reanalysis.
• AZtecSynergy: AZtecSynergy collects energy dispersive X-ray and electron backscatter diffraction data at the same time. The tools for integrated acquisition sit in one place, so there is no switching between navigators during a run, and phase selection and calibration are handled together.
• AZtecTEM: AZtecTEM is the Oxford Instruments energy dispersive X-ray software written for transmission electron microscopy. It takes a system level approach to characterising materials at the nanoscale, building on the company's long standing work in TEM detector technology.
• AZtec LayerProbe: LayerProbe is a thin film analysis option for the AZtec energy dispersive X-ray system. It characterises multiple layers beneath the specimen surface without destroying the sample, offering higher resolution than dedicated thin film measurement tools at lower cost.
• AZtecFeature: AZtecFeature is the Oxford Instruments particle analysis package for the SEM. The current release includes the FeatureExpress upgrade, which raises throughput while holding accuracy for the range of particle analysis applications the software is used for.
• AZtec3D: AZtec3D provides an interface that starts simultaneous energy dispersive X-ray and electron backscatter diffraction acquisition and analysis from outside AZtec. This lets the analysis be driven by automated processes such as FIB-SEM milling through a 3D software module.
• AZtecFlex: AZtecFlex is a personal copy of AZtec for offline work. It lets users open and process their own data away from the microscope, covering energy dispersive X-ray, wavelength dispersive X-ray and electron backscatter diffraction datasets, and try advanced features.
• AZtecGSR: AZtecGSR is the Oxford Instruments gunshot residue analysis package for forensic laboratories. It runs SEM based particle analysis tuned to gunshot residue, with element identification handled by the Tru-Q IQ algorithms used across the AZtec range.
• AZtecSteel: AZtecSteel is an automated steel inclusion analysis package for energy dispersive X-ray microanalysis in the SEM. It detects, measures and analyses inclusions, processes the results to published standard methods and plots complex ternary diagrams.
• AZtecMineral: AZtecMineral is an automated mineral liberation analysis package for multipurpose SEMs. It supports ore characterisation, metal recovery data and process yield work, and is also used to automate rock characterisation that would otherwise be done optically.
• AZtecClean: AZtecClean is the Oxford Instruments package for technical cleanliness monitoring, used mainly in the automotive and aerospace industries. It detects and analyses particles on filters and components, with element identification by the AZtec Tru-Q algorithms.
• AZtecAM: AZtecAM is an automated package for analysing the metal powders used in additive manufacturing. Based on AZtecFeature, it detects contaminants, characterises powder grain morphology and allows individual grains to be examined in detail.
• AZtecBattery: AZtecBattery is an automated package for analysing the powders used in battery manufacture. It identifies contaminants so their source can be traced, from the mining facility through to the battery plant, and characterises the powders in full at high throughput.
• AZtecPharma: AZtecPharma adds electronic record controls to AZtec for pharmaceutical and biomedical laboratories. It provides individual user login, digital signatures and a data audit trail with a viewer, so that electronic records stand as the equivalent of paper records.
• AZtecGeo: AZtecGeo is a geoscience user profile for the AZtecFeature particle analysis software. It guides automated quantification of mineral morphology and composition across large samples, and ships with a pre made classification scheme to turn chemistry into mineralogy.
• AZtecAsbestos: AZtecAsbestos detects fibres in the SEM using a machine learning model, then analyses them by energy dispersive X-ray and classifies the result. It is built for fast screening of samples and for automated runs across multiple samples with little instrument downtime.
• Relate: Relate is a correlative software package for multimodal microscopy datasets, covering electron microscopy, EDS, EBSD, Raman spectroscopy, light microscopy and atomic force microscopy. It correlates data from different instruments and renders it in 2D and 3D.
• Ergo AFM Software: The advanced software platform included with Asylum Research Cypher and Jupiter atomic force microscopes. GetReal technology calibrates the cantilever automatically each time and the AUTOPILOT algorithm works out the optimal imaging settings, while AFM images can be analysed inside Ergo without moving to another package. Scanning Capacitance Microscopy and Conductive AFM are supported for high resolution, high sensitivity nanoelectrical data, and advanced modes hand over to Asylum's IGOR Pro based software. Ergo Advanced Automation and Ergo KPFM are available as extensions.
• AR Maps: An analysis package for AFM data that reads both Ergo and Igor files from Jupiter family instruments. The standard level provides extensive tools to correct, normalise and denoise measured data, characterises surface and section data with ISO standard roughness, step height and distance measurement and histograms, and lets users build their own processing recipes. The advanced level adds batch processing and automation, statistics reports across datasets, critical dimension and trench analysis with cantilever tip deconvolution, image stitching and particle analysis.
• Solis Software: Solis is Andor's control programme for its cameras and spectrographs, supplied as a 32-bit and fully 64-bit Windows application with extensive data acquisition and export options. AndorBasic adds a macro language for control of acquisition, processing, display and export. Three variants are published: Solis I for image capture and analysis, Solis S tailored to spectroscopy acquisition, and Solis T for time-resolved work with control of the iStar camera range.
• Oi View: Oi View is the Oxford Instruments NanoAnalysis digital platform that connects a laboratory's systems to a web service, so users can follow live analyses, system health and utilisation from anywhere. Health and utilisation reports compare system productivity and flag actions that keep a system in good condition, while Oi Library gives a curated view of the latest Oxford Instruments documentation. My Consultations records the outcome of discussions with Oxford Instruments application experts and shares them with other Oi View users. Connection needs AZtec version 6.1 or newer, an internet connection on the system, and agreement to the telemetry terms in Assist.
• PTIQ: PTIQ is the next generation control software for Oxford Instruments plasma systems, built for the PlasmaPro, Atomfab and Ionfab platforms in both research laboratories and volume production. It logs process data at millisecond accuracy with 1,000-point logging, offers visual proactive readiness indicators, and provides calibration, fault finding and device fingerprinting tools alongside fully programmable multi-cassette load and unload scheduling. The interface is SEMI E95 compliant, touchscreen compatible for cleanroom and yellow-light areas, and supports multi-user profiles for operators, engineers and maintenance teams. Optional modules extend it further, including DiagnostIQs for advanced diagnostics, calibration and predictive maintenance, and a Web API with CSV recipe run data export.
• 1000 Series Glass X-ray Tube: Built as a glass envelope source for demanding duty cycles including continuous operation, the 1000 Series combines high flux with spot size stability. The 90507 and the other 1000 Series tubes carry a very small isostatically focused spot for high resolution work such as mini C-Arm fluoroscopy, while the robust electron gun assembly suits integrated X-ray sources where heat dissipation is a constraint. Long tube life comes from ultra-high vacuum held by the Oxford Instruments getter technology. The tube operates in bi-polar mode.
• 1500 Series Glass X-ray Tube: A 50kV, 50W glass envelope X-ray tube intended for work that needs high flux density and continuous running. Its high stability, high intensity tube technology suits medical imaging, XRF and most industrial inspection and non-destructive testing tasks that call for high resolution, including PCB assembly, battery, plastic, metal and mechanical parts inspection. The tube can also be supplied in a stainless steel, lead lined package filled with dielectric oil for maximum shielding and heat dissipation, effectively replicating the Jupiter 5000 Series packaged tube with its high voltage and filament connectors for plug and play use. Ultra-high vacuum maintained by the Oxford Instruments getter technology gives long tube life.
• 1501 Series Glass X-ray Tube: Rated at 50kV and 50-75W, the 1501 Series answers the need for higher current at lower operating potentials while keeping high flux density and continuous operation. It serves medical imaging, XRF and industrial inspection or non-destructive testing that demands high resolution, covering PCB assembly, battery, plastic, metal and mechanical parts. A stainless steel, lead lined package filled with dielectric oil is available for maximum X-ray shielding and heat dissipation, and the series comes in a range of spot sizes and targets. Ultra-high vacuum held by the Oxford Instruments getter technology supports long tube life.
• 1550 Series Glass X-ray Tube: This 50kV, 50W glass envelope tube pairs Oxford Instruments high stability, high intensity technology with grid controlled variable focus, so it produces very small focal spots. That makes the 1550 Series a good match for industrial inspection and non-destructive testing that needs high resolution, including PCB assembly, battery, plastic, metal and mechanical parts inspection, and it also works well with X-ray optics. Supplied in a stainless steel, lead lined package filled with dielectric oil, the same tube becomes the Apogee 5500 Series packaged assembly with high voltage and filament connectors for plug and play operation. Long tube life follows from ultra-high vacuum maintained with the company's getter technology.
• OpenView Series Glass X-ray Tube: A 40 degree cone angle is what sets this tube apart, opening up a large field of view even when magnification is high. Oxford Instruments aims it at high resolution imaging in cabinet X-ray systems and other work that needs precision and clarity. An artifact-free beryllium window can be specified for low contrast imaging where background and subject densities sit close together, which brings soft tissue biopsy within reach. Ultra-high vacuum maintained with the company's getter technology supports long tube life.
• 3000 Series 30kV X-ray Tube: Developed for high flux stability and long life, the 3000 Series potted tube is suited to continuous operation. It is encapsulated in silicone rubber and features a grounded cathode together with a low attenuation beryllium window, giving a low cost route to high spectral purity radiation. Targets are offered in tungsten, titanium, molybdenum, gold, iron, palladium, rhodium and silver, at anode powers from 6W to 27.2W depending on part number.
• Apogee 5500 Series Radiation Shielded X-ray Tube: Rated at 50kV and 50W, this packaged assembly targets duty where flux density stays high and the source runs continuously. Grid controlled variable focus layered on the high stability, high intensity tube technology yields very small focal spots, which serves high resolution industrial inspection and non-destructive testing across PCB assembly, battery, plastic, metal and mechanical parts, and also works well behind X-ray optics. Housing is a compact stainless steel, lead lined enclosure filled with dielectric oil for maximum shielding and heat dissipation, fitted with high voltage and filament connectors so the unit runs plug and play.
• Jupiter 5000 Series Radiation Shielded X-ray Tube: This packaged tube is rated 50kV and 50W and is built for continuous running at high flux density. Highly stable, high intensity tube technology puts it to work in medical imaging and in most high resolution industrial inspection and non-destructive testing, covering PCB assembly, battery, plastic, metal and mechanical parts. Dielectric oil inside a stainless steel, lead lined package handles shielding and heat dissipation, while integral high voltage and filament connectors make the unit plug and play. A wide range of spot sizes and target materials is offered.
• Pinnacles 50kV Microfocus X-ray Source: Developed for applications needing high resolution across a wide angle field of view, the Pinnacles 50kV microfocus source offers high flux output from a compact body. The package is fully radiation shielded and insulated, with an integrated high voltage cable on the side of the tube to simplify connection. The Shasta uF power supply has been optimised to drive this tube.
• Shasta 2 Series X-ray Tube Power Supply: The Shasta 2 Series is a robust supply optimised to power grounded filament X-ray tubes from Oxford Instruments, and its versatility lets it drive virtually any grounded filament tube. Closed loop emission control circuitry with low ripple delivers a highly regulated beam current and high stability, and both local and remote analogue control are provided for setting voltage and emission current. Models with grid focus control are matched to the Apogee tubes.