Brand: Oxford Instruments | Category: Nanotechnology
The advanced software platform included with Asylum Research Cypher and Jupiter atomic force microscopes. GetReal technology calibrates the cantilever automatically each time and the AUTOPILOT algorithm works out the optimal imaging settings, while AFM images can be analysed inside Ergo without moving to another package. Scanning Capacitance Microscopy and Conductive AFM are supported for high resolution, high sensitivity nanoelectrical data, and advanced modes hand over to Asylum's IGOR Pro based software. Ergo Advanced Automation and Ergo KPFM are available as extensions.
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An analysis package for AFM data that reads both Ergo and Igor files from Jupiter family instruments. The standard level provides extensive tools to correct, normalise and denoise measured data, characterises surface and section data with ISO standard roughness, step height and distance measurement and histograms, and lets users build their own processing recipes. The advanced level adds batch processing and automation, statistics reports across datasets, critical dimension and trench analysis with cantilever tip deconvolution, image stitching and particle analysis.
The process monitoring software suite for Renishaw additive manufacturing systems. It collects and visualises data from the LaserVIEW, MeltVIEW and CameraVIEW sensors so a build can be reviewed layer by layer and compared against earlier builds.
Solis is Andor's control programme for its cameras and spectrographs, supplied as a 32-bit and fully 64-bit Windows application with extensive data acquisition and export options. AndorBasic adds a macro language for control of acquisition, processing, display and export. Three variants are published: Solis I for image capture and analysis, Solis S tailored to spectroscopy acquisition, and Solis T for time-resolved work with control of the iStar camera range.