Jandel Engineering in Bangladesh

Vvon Technologies Limited supplies, installs and services Jandel Engineering equipment across Bangladesh. 28 products are catalogued across Nanotechnology.

Categories

• Electrical & Electrochemical Characterisation (21)
• Electron Microscopy & Microanalysis (4)
• Accessories & Modules (3)

Products

• Jandel General Purpose System: The General Purpose System pairs the RM3000+ Test Unit with the Multiheight Probe Stand and is the combination Jandel sells most. The adjustable probe height takes samples from thin layers and wafers up to ingots 250 mm high, with thicker samples accommodated on request.
• Jandel Multipurpose Four Point Probe System: The Multipurpose System combines the Multiheight Probe Stand and RM3000+ Test Unit with a removable micrometer controlled X-Y table. Small samples such as coated glass slides can be positioned precisely, and with the table removed the stand takes wafers and ingots.
• Jandel Wafer Probing System: The Wafer Probing System pairs the RM3000+ Test Unit with the Multiposition Probe Stand for repeatable measurement across wafers. Indexed theta and linear movements return the probe to set points, which suits five point and nine point wafer uniformity routines.
• Jandel Portable Probing System: The Portable Probing System pairs the HM21 Test Unit with the Hand Applied Probe for measurements made away from a fixed stand. It handles thin layers, wafers and large ingots, but the high downward force means it is not suitable for fragile unsupported samples.
• Jandel RM3000+ Test Unit: The RM3000+ is Jandel's constant current source and digital voltmeter for four point probe measurement. It covers the widest range of the Jandel test units and is the unit supplied with the General Purpose, Wafer and Multipurpose systems. Readings are given in sheet resistance or volume resistivity.
• Jandel ResTest Test Unit: The ResTest is a constant current source and digital voltmeter with a colour screen. It shows readings directly in millivolts, sheet resistance and volume resistivity, and stores results on board or straight to a memory stick, which suits routine production checks.
• Jandel HM21 Test Unit: The HM21 is Jandel's compact four point probe test unit with six switched constant current settings. It is the unit paired with the Hand Applied Probe in the Portable Probing System, so measurements can be made away from the laboratory bench.
• Jandel Multiheight Four Point Probe Stand: The Multiheight Probe Stand raises and lowers the probe mechanism so samples from thin films to large ingots can be measured on one stand. It is Jandel's most popular stand and its base carries four mounting holes for accessories such as an eight inch wafer table.
• Jandel Multiheight / Microposition Probe Stand: This version of the Multiheight stand adds a micrometer controlled X-Y stage for small samples. Four screws release the stage, so the same stand returns to handling large wafers and ingots without further adjustment.
• Jandel Multiposition Wafer Probe Stand: The Multiposition Probe Stand is built for wafer measurement, with indexed rotation and linear travel that return the probe to the same points run after run. Two sizes are offered at the same cost, the smaller one being easier for placing small wafers on the table.
• Jandel Microposition Probe Stand: The Microposition Probe Stand is for small samples and printed lines where the probe has to be placed accurately. Micrometer slides move the sample under the probe and the sample can also be rotated through a full turn.
• Jandel Universal Probe Station: The Universal Probe Station handles both four point probe and three point spreading resistance measurements. All four needles are adjustable for load and can be replaced by the user, and an X-Y stage gives fine movement for targeting small samples.
• Jandel Hand Applied Probe: The Hand Applied Probe rests directly on the sample rather than being held above it, which avoids the reading drift seen with fully handheld methods. It measures thin layers, wafers and large ingots, but the strong downward force rules out fragile unsupported samples.
• Jandel cylindrical four point probe: The cylindrical four point probe head fits Jandel probe stands, some OEM mapping systems and equipment made by Four Dimensions. The plain cylindrical body also suits customers building their own probe mount, and a mounting adapter is offered.
• Jandel Alessi Compact Probe: The Compact Probe is made for Veeco FPP5000 and FPP100 equipment and also fits GRQ tools. It replaces the square bodied probe heads originally made by Alessi. Some Veeco tools take the cartridge with lead instead, so the tool should be confirmed before ordering.
• Jandel Veeco Cartridge with Lead: The cartridge with lead probe head is made for use on customer built equipment, some Veeco tools, and installations that previously used an A and M Fell style probe. Other Veeco tools take the Compact Probe instead.
• Napson: This cartridge probe with a 4 pin connector is made for Napson equipment such as the RT70 and RT3000, and for older Keithley Omega tools. Jandel manufactures it, but it is sold only through Napson and their authorised representatives.
• Napson Miniature: The miniature cartridge with positioning key is made for older Napson and Kokusai equipment. It closely resembles the AIT cartridge probe, so the target tool should be confirmed before ordering. It is built to the same mechanical tolerances as the rest of the Jandel probe range.
• AIT: The miniature cartridge probe for AIT equipment fits tools named SR1000N, SR2000N and similar. Its tapped mounting holes also make it a practical choice for customers building their own probe holder. It resembles the Napson miniature cartridge closely, so the two should not be confused.
• CDE ResMap: This cartridge with a 6 way connector is made to suit Creative Design Engineering systems such as the ResMap 168 and ResMap 178. It carries a distinctive black nosepiece because the similar KLA Tencor Prometrix head is not interchangeable with it.
• KLA-Tencor-Prometrix: This cartridge with a 6 way connector is made to suit KLA, Tencor and Prometrix systems such as the RS55, RS75 and RS100. It looks similar to the CDE head but the two are not interchangeable, so care is needed where both tools are on site.
• Jandel Very Close Spacing probe: The very close spacing probe has 0.5 mm needle spacing for measurements taken close to the edge of a sample or on very small samples. The finer needles it uses call for more careful handling than a standard spacing probe.
• Jandel Macor four point probe: The Macor probe is built for high and low temperature measurement. In an oven it works from about 80 K to 600 K, and if only the sample is heated it can be used up to 1000 K, though prolonged contact should be avoided. It is not jewel guided.
• Jandel High Vacuum four point probe: This version of the cylindrical probe is prepared for vacuum service. It is unanodised, blind holes are removed where possible, connections are crimped rather than soldered and a ruby ball is used for the insulation pad.
• Jandel custom probes: Jandel builds probes to customer specification where a catalogue head will not do. Three, four, five and six point probes have been produced, and the company invites enquiries about other configurations.
• Jandel Stability Shroud: The stability shroud is a removable push fit collar for the probe head. Jandel advises against handling probe heads by hand because the tungsten carbide needles are thin, and the shroud is offered where handling cannot be avoided.
• Jandel Light Shrouds: The light shroud is a press fit shield for measurements on photosensitive samples. The two piece design fits the Multiposition, Microposition and Multiheight probe stands, and a lined black cloth shroud is offered for larger items.
• Jandel Reference Sample: The reference sample is indium tin oxide coated glass used to check that a four point probing system is set up correctly and giving sensible readings. Values are assigned in house rather than being NIST traceable, and are printed on the sample.