Electron Microscopy in Bangladesh

EDIBON teaching and research units for the electron microscopy laboratory, supplied, installed and commissioned in Bangladesh by Vvon with faculty training included. 16 units available.

16 products from 1 manufacturer: Hitachi High-Tech.

Products

• Tabletop Microscope TM4000PlusII/TM4000II — Hitachi High-Tech: The TM4000II and TM4000PlusII are benchtop scanning electron microscopes for fast imaging with little sample preparation. They take specimens up to 80 mm across using backscattered electron detection, with secondary electron and mixed signal modes on the Plus model.
• Tabletop Microscope TM4000PlusIII/TM4000III — Hitachi High-Tech: The TM4000III and TM4000PlusIII are the newest benchtop scanning electron microscopes in the Hitachi TM range. They image conductive and non conductive samples using a charge up reduction mode, and take specimens up to 80 mm diameter and 50 mm thick.
• Scanning Electron Microscope FlexSEM 1000 II — Hitachi High-Tech: The FlexSEM 1000 II is a variable pressure scanning electron microscope with a tungsten filament source. It images uncoated and outgassing samples in a controlled pressure chamber, and supports energy dispersive X-ray analysis and STEM specimen holders.
• Scanning Electron Microscopes SU3800/SU3900 — Hitachi High-Tech: The SU3800 and SU3900 are variable pressure scanning electron microscopes with a five axis motorised stage and automated functions. The SU3900 carries a larger multipurpose chamber that takes specimens up to 300 mm diameter for bulky industrial samples.
• High Resolution Schottky Scanning Electron Microscope SU3900SE/SE Plus SU3800SE/SE Plus — Hitachi High-Tech: The SE Series brings Schottky field emission performance to the SU3800 and SU3900 platforms. Four models cover standard and extra large chambers, with SE Plus versions adding deceleration mode and dedicated low energy secondary electron detection.
• Schottky Field Emission Scanning Electron Microscope SU5000 — Hitachi High-Tech: The SU5000 is a Schottky field emission scanning electron microscope with an out lens objective, moving between high vacuum and variable pressure operation. Its EM Wizard interface guides imaging conditions and a drawer type stage accepts large specimens.
• Ultrahigh-Resolution Schottky Scanning Electron Microscope SU7000 — Hitachi High-Tech: The SU7000 is a Schottky field emission scanning electron microscope that collects several secondary and backscattered signals at once. Up to six channels can be displayed and stored together, and an optional variable pressure mode widens the range of samples.
• Ultrahigh-Resolution Scanning Electron Microscope SU8600 — Hitachi High-Tech: The SU8600 is a cold field emission scanning electron microscope for ultrahigh resolution imaging. An upper detector with ExB filter mixes secondary and backscattered signals, and optional detectors add cathodoluminescence and STEM capability.
• Ultrahigh-Resolution Schottky Scanning Electron Microscope SU8700 — Hitachi High-Tech: The SU8700 is a Schottky field emission scanning electron microscope offering high probe current for fast microanalysis alongside ultrahigh resolution imaging. Low landing voltage operation without stage bias suits beam sensitive specimens.
• Ultrahigh-Resolution Scanning Electron Microscope SU9600 — Hitachi High-Tech: The SU9600 is the flagship Hitachi cold field emission scanning electron microscope, built for subnanometre observation. An in lens objective and ExB detection give good signal to noise at low probe current, for semiconductor devices and advanced materials.
• Field Emission Transmission Electron Microscope HF5000 — Hitachi High-Tech: The HF5000 is a 200 kV aberration corrected TEM and STEM with a cold field emission source. A single objective lens configuration combines high specimen tilt with large solid angle EDX detection, for imaging and analysis at the atomic scale.
• Transmission Electron Microscope HT7800 Series — Hitachi High-Tech: The HT7800 Series is a 120 kV transmission electron microscope that automates routine alignment and setting. Three models trade maximum magnification against stage tilt range, covering work from life science sectioning through to materials development.
• Focused Ion and Electron Beam System Ethos NX5000 — Hitachi High-Tech: The Ethos NX5000 combines a field emission SEM column with a gallium focused ion beam for nanoscale processing and imaging. A microsampling system with orientation control prepares uniform TEM lamellas, and a triple beam option reduces milling artefacts.
• Real-time 3D Analytical FIB-SEM NX9000 — Hitachi High-Tech: The NX9000 arranges its SEM and FIB columns orthogonally so cross sections are imaged at normal incidence. This removes foreshortening during serial sectioning and allows 3D EDS and 3D EBSD to be collected without moving the stage.
• Auto Capture for Array Tomography ACAT — Hitachi High-Tech: ACAT is an automated image acquisition option for serial section analysis on Hitachi field emission SEMs. It aligns and captures a chosen region of interest across many consecutive sections, correcting for rotation, compression and tears so array tomography runs without operator input.
• MirrorCLEM System for Correlative Light and Electron Microscopy — Hitachi High-Tech: MirrorCLEM correlates specimens between optical and electron microscopes. A specimen imaged on any light microscope is transferred to the Hitachi SEM stage, where the optical image acts as an anchor map that drives the stage to a chosen region and overlays both images in real time.

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