J.A. Woollam in Bangladesh

Vvon Technologies Limited supplies, installs and services J.A. Woollam equipment across Bangladesh. 11 products are catalogued across Nanotechnology.

Categories

• Ellipsometry & Thin Film Metrology (9)
• Instrument Software (2)

Products

• alpha 2.0 Ellipsometer: The alpha 2.0 is the entry level benchtop spectroscopic ellipsometer for routine thickness and refractive index measurement. Place the sample, choose a model and press measure, and results follow in seconds. It suits single layer dielectrics, self assembled monolayers, organics and coatings on glass.
• iSE Ellipsometer: The iSE is an in situ spectroscopic ellipsometer for real time monitoring of thin film deposition and etch. The source and receiver mount on the process chamber and measure through viewports, giving growth rate, thickness and optical constants with sub angstrom sensitivity for feedback control.
• theta-SE Ellipsometer: The theta-SE is a benchtop mapping ellipsometer for checking thin film uniformity across wafers up to 300 mm. A patented dual theta rotation stage, focused beam and camera alignment keep the footprint close to the wafer size while producing thickness and optical constant maps.
• M-2000 Ellipsometer: The M-2000 is a rotating compensator ellipsometer that collects hundreds of wavelengths at once with CCD detection. Modular optics let it sit on a table top base or attach to a process chamber, so the same instrument covers in situ monitoring, large area mapping and general thin film characterisation.
• RC2 Ellipsometer: The RC2 uses two synchronously rotating compensators and was the first commercial spectroscopic ellipsometer to collect all 16 elements of the Mueller matrix. That makes it suited to anisotropic materials, liquid crystals and nanostructures as well as ordinary thin film work.
• VASE Ellipsometer: The VASE is the established variable angle research ellipsometer, using a rotating analyser with the AutoRetarder and a custom scanning monochromator. A vertical sample mount supports reflection, transmission and scattering geometries on semiconductors, dielectrics, polymers, metals and multilayers.
• IR-VASE Mark II Ellipsometer: The IR-VASE Mark II joins the chemical sensitivity of FTIR spectroscopy to spectroscopic ellipsometry across 1.7 to 30 microns. It gives n and k over the whole measured range without Kramers Kronig extrapolation, and needs no vacuum or reference sample, so liquid and solid interfaces can be studied.
• VUV-VASE Ellipsometer: The VUV-VASE measures from the vacuum ultraviolet to the near infrared and is used for optical characterisation of lithography thin films, high bandgap materials and immersion fluids. Placing the monochromator before the sample limits exposure of photosensitive materials during measurement.
• T-Solar Ellipsometer: The T-Solar is a photovoltaic measurement system designed specifically for textured samples. It is based on the established M-2000 rotating compensator spectroscopic ellipsometer and measures hundreds of wavelengths across the UV, visible and near infra-red. To cope with rough, textured surfaces that greatly reduce the reflected signal, it pairs a special high-intensity lamp source with an Intensity-Optimizer that adjusts the light source automatically to the ideal range for the sample. An adjustable tilt-rotation stage aligns the pyramid structures of alkaline-etched monocrystalline surfaces, which makes the system well suited to characterising AR coatings on etched silicon.
• CompleteEASE Software: CompleteEASE is J.A. Woollam's data acquisition and model development environment for ellipsometry, described by the company as the culmination of 35 years of ellipsometry experience and software development that began in the 1980s. It handles versatile measurements including automated sample mapping and spectroscopic ellipsometry, with recipe creation for automated collection and analysis and a scan pattern editor working in cartesian or polar coordinates. Modelling tools include a thickness pre-fit algorithm, standard grid and randomised global fitting, an alternate models test covering surface roughness, grading and anisotropy, a B-Spline layer for semi-absorbing materials and a General Oscillator (Gen-Osc) layer, with regression by an optimised Levenberg-Marquardt routine that works with multi-core processors. Pattern recognition and deskew, Mueller matrix measurement and decomposition, and in-situ real time monitoring with a multi-time-slice analysis mode are also provided.
• WVASE Software: WVASE is J.A. Woollam's ellipsometric analysis programme, which the company describes as the most powerful and comprehensive available. Beyond ellipsometric data it also handles reflectance, transmission and neutron reflectivity data for thin film characterisation. Its generalised oscillator layer offers built in Lorentz, Gaussian, Harmonic, Drude, Tauc-Lorentz, Cody-Lorentz, Tanguy and PSEMI functions. The Meta-6 layer supports metamaterials with up to four constitutive functions, handles anisotropic structures requiring 3×3 tensors, and works with generalised ellipsometry and Mueller matrix ellipsometry measurements.