Electron Microscopy & Microanalysis in Bangladesh

Electron microscopes, sample preparation tools and microanalysis systems from Hitachi High-Tech, Oxford Instruments, Denton Vacuum and Renishaw. Compare the imaging, analysis and preparation workflow before choosing a configuration for your laboratory in Bangladesh.

45 products from 4 manufacturers: Denton Vacuum, Hitachi High-Tech, Oxford Instruments, Renishaw.

Plan your next step

Define the result you need from your microscopy setup

An image, an elemental map and a crystallographic measurement require different capabilities. Start with the research question, then identify the microscope, analytical detectors and sample preparation needed together.

• Describe the material, specimen dimensions and condition, smallest features of interest and expected workload.
• Separate imaging from EDS elemental analysis or EBSD crystallography. Ask the manufacturers to confirm detector, stage, port and software compatibility.
• For an upgrade, provide the existing microscope model and configuration. Request a sample demonstration and a quotation that separates preparation tools, instrument options and installation requirements.

SU3800/SU3900 SEM family: Explore variable-pressure imaging configurations.

Ultim Max Infinity EDS: Review an elemental-analysis detector option for compatible SEM systems.

Desk V sample preparation: Consider coating requirements alongside the imaging method.

Discuss your microscopy application

Products

• Infinity FA System — Denton Vacuum: An etching tool for semiconductor failure analysis, thin film profiling and delayering. It combines ion beam etch, reactive ion beam etch and chemically assisted ion beam etch so that layers of mixed composition can be removed at matched rates.
• BenchTop Turbo — Denton Vacuum: A compact high vacuum system for low voltage resistive thermal evaporation and sputtering, sized to fit within 32 inches of bench width. It is used for high vacuum carbon coating, high resolution microscopy coatings and rotary shadowing, and is run from a touch screen interface.
• Desk V — Denton Vacuum: A bench top sample preparation system that combines magnetron sputtering with thermal carbon evaporation for electron microscopy. An adjustable rotating and tilting stage gives even coverage on samples with irregular surfaces, and a broad range of coating materials including iridium can be deposited.
• Tabletop Microscope TM4000PlusII/TM4000II — Hitachi High-Tech: The TM4000II and TM4000PlusII are benchtop scanning electron microscopes for fast imaging with little sample preparation. They take specimens up to 80 mm across using backscattered electron detection, with secondary electron and mixed signal modes on the Plus model.
• Tabletop Microscope TM4000PlusIII/TM4000III — Hitachi High-Tech: The TM4000III and TM4000PlusIII are the newest benchtop scanning electron microscopes in the Hitachi TM range. They image conductive and non conductive samples using a charge up reduction mode, and take specimens up to 80 mm diameter and 50 mm thick.
• Scanning Electron Microscope FlexSEM 1000 II — Hitachi High-Tech: The FlexSEM 1000 II is a variable pressure scanning electron microscope with a tungsten filament source. It images uncoated and outgassing samples in a controlled pressure chamber, and supports energy dispersive X-ray analysis and STEM specimen holders.
• Hitachi SU3500 SEM — Hitachi High-Tech: Earlier-model variable-pressure scanning electron microscope, retained for SU3500 reference and configuration enquiries. Confirm current instrument, spare-part and support availability before ordering. For a new microscope shortlist, compare the separately catalogued SU3800/SU3900 family against your sample and analysis requirements.
• Scanning Electron Microscopes SU3800/SU3900 — Hitachi High-Tech: The SU3800 and SU3900 are variable pressure scanning electron microscopes with a five axis motorised stage and automated functions. The SU3900 carries a larger multipurpose chamber that takes specimens up to 300 mm diameter for bulky industrial samples.
• High Resolution Schottky Scanning Electron Microscope SU3900SE/SE Plus SU3800SE/SE Plus — Hitachi High-Tech: The SE Series brings Schottky field emission performance to the SU3800 and SU3900 platforms. Four models cover standard and extra large chambers, with SE Plus versions adding deceleration mode and dedicated low energy secondary electron detection.
• Schottky Field Emission Scanning Electron Microscope SU5000 — Hitachi High-Tech: The SU5000 is a Schottky field emission scanning electron microscope with an out lens objective, moving between high vacuum and variable pressure operation. Its EM Wizard interface guides imaging conditions and a drawer type stage accepts large specimens.
• Ultrahigh-Resolution Schottky Scanning Electron Microscope SU7000 — Hitachi High-Tech: The SU7000 is a Schottky field emission scanning electron microscope that collects several secondary and backscattered signals at once. Up to six channels can be displayed and stored together, and an optional variable pressure mode widens the range of samples.
• Ultrahigh-Resolution Scanning Electron Microscope SU8600 — Hitachi High-Tech: The SU8600 is a cold field emission scanning electron microscope for ultrahigh resolution imaging. An upper detector with ExB filter mixes secondary and backscattered signals, and optional detectors add cathodoluminescence and STEM capability.
• Ultrahigh-Resolution Schottky Scanning Electron Microscope SU8700 — Hitachi High-Tech: The SU8700 is a Schottky field emission scanning electron microscope offering high probe current for fast microanalysis alongside ultrahigh resolution imaging. Low landing voltage operation without stage bias suits beam sensitive specimens.
• Ultrahigh-Resolution Scanning Electron Microscope SU9600 — Hitachi High-Tech: The SU9600 is the flagship Hitachi cold field emission scanning electron microscope, built for subnanometre observation. An in lens objective and ExB detection give good signal to noise at low probe current, for semiconductor devices and advanced materials.
• Field Emission Transmission Electron Microscope HF5000 — Hitachi High-Tech: The HF5000 is a 200 kV aberration corrected TEM and STEM with a cold field emission source. A single objective lens configuration combines high specimen tilt with large solid angle EDX detection, for imaging and analysis at the atomic scale.
• Transmission Electron Microscope HT7800 Series — Hitachi High-Tech: The HT7800 Series is a 120 kV transmission electron microscope that automates routine alignment and setting. Three models trade maximum magnification against stage tilt range, covering work from life science sectioning through to materials development.
• Nanoscale Device Characteristics Analysis System Nano-Prober NP8000 — Hitachi High-Tech: The NP8000 Nano-Prober is a SEM based probing system for electrical characterisation of devices at 5 nm nodes and beyond. It supports electron beam absorbed current imaging, pulsed IV measurement and a temperature controlled stage inside the vacuum chamber.
• Focused Ion and Electron Beam System Ethos NX5000 — Hitachi High-Tech: The Ethos NX5000 combines a field emission SEM column with a gallium focused ion beam for nanoscale processing and imaging. A microsampling system with orientation control prepares uniform TEM lamellas, and a triple beam option reduces milling artefacts.
• Real-time 3D Analytical FIB-SEM NX9000 — Hitachi High-Tech: The NX9000 arranges its SEM and FIB columns orthogonally so cross sections are imaged at normal incidence. This removes foreshortening during serial sectioning and allows 3D EDS and 3D EBSD to be collected without moving the stage.
• FIB Micro-sampling System — Hitachi High-Tech: The Micro-sampling System extracts a small pillar of material from a chosen point on a wafer using the ion beam inside the vacuum chamber of a FIB system. The extracted sample is then trimmed and transferred for analysis by TEM or STEM.
• Ion Milling System ArBlade 5000 — Hitachi High-Tech: The ArBlade 5000 is a broad argon ion beam milling system that prepares cross sections and flat milled surfaces for electron microscopy. Intermittent beam irradiation and a swinging stage produce clean faces across a wide range of materials.
• Ion Milling System IM4000II — Hitachi High-Tech: The IM4000II is an argon ion milling system that carries out both cross section milling and flat milling in one instrument. Options for cooled temperature control and an air protection holder allow preparation of heat sensitive and air sensitive specimens.
• Sample Cleaner ZONESEMII — Hitachi High-Tech: The ZONESEMII is a benchtop sample cleaner that removes hydrocarbon contamination from SEM specimens and holders using vacuum controlled UV irradiation and activated oxygen. It also acts as a vacuum store to prevent holder outgassing.
• Sample Cleaner ZONETEM II — Hitachi High-Tech: The ZONETEM II is a desktop sample cleaner for TEM specimens. It uses vacuum controlled UV irradiation to remove hydrocarbon contamination from the sample surface before imaging, without the use of chemicals, supply gases or reagents.
• Auto Capture for Array Tomography ACAT — Hitachi High-Tech: ACAT is an automated image acquisition option for serial section analysis on Hitachi field emission SEMs. It aligns and captures a chosen region of interest across many consecutive sections, correcting for rotation, compression and tears so array tomography runs without operator input.
• MirrorCLEM System for Correlative Light and Electron Microscopy — Hitachi High-Tech: MirrorCLEM correlates specimens between optical and electron microscopes. A specimen imaged on any light microscope is transferred to the Hitachi SEM stage, where the optical image acts as an anchor map that drives the stage to a chosen region and overlays both images in real time.
• Ultim Max Infinity — Oxford Instruments: Ultim Max Infinity is the Oxford Instruments silicon drift detector range for energy dispersive X-ray analysis in the SEM. Sensor sizes from 40 to 170 square millimetres all give the same analytical performance, with a motorised slide for insertion and retraction.
• Ultim Extreme Infinity — Oxford Instruments: Ultim Extreme Infinity is a windowless energy dispersive X-ray detector for ultra high resolution field emission SEM. Its shaped sensor sits close to the sample at very short working distance, so elemental analysis can be run at the low kV used for nanomaterials and surfaces.
• Xplore — Oxford Instruments: Xplore is a compact energy dispersive X-ray detector for routine microanalysis in the SEM. It uses the same X4 electronics as the larger Ultim Max Infinity detectors in a smaller package, with motorised insertion and extra cooling removed to reduce parts and allow in field repair.
• XploreCompact for TTM — Oxford Instruments: XploreCompact is an energy dispersive X-ray detector sized to fit inside the outer casing of a table top microscope with no cut outs. It carries the same detector technology as the larger Ultim Max range, bringing AZtecLive real time chemical imaging to benchtop SEMs.
• Unity — Oxford Instruments: Unity is a combined backscattered electron and X-ray detector for the SEM. Both sensor types sit in one package directly beneath the pole piece, which raises X-ray sensitivity and removes the shadowing that affects conventional detectors on rough and unpolished samples.
• Symmetry S3 — Oxford Instruments: Symmetry S3 is an all in one electron backscatter diffraction detector built on a CMOS sensor with lens free fibre optic coupling. It combines high indexing speed with the sensitivity needed for low energy and low current work, and the detector tilt is controlled from software.
• C-Nano+ — Oxford Instruments: C-Nano+ is an entry level electron backscatter diffraction detector using a customised CMOS sensor. Its high pixel resolution suits detailed strain analysis, and the lens free fibre optic design gives the sensitivity needed for beam sensitive and nanocrystalline materials.
• C-Swift+ — Oxford Instruments: C-Swift+ is a high speed entry level electron backscatter diffraction detector for routine materials analysis and high throughput characterisation. It uses a customised CMOS sensor with fibre optics, and can trade speed for pattern quality on complex multi phase samples.
• OmniProbe — Oxford Instruments: OmniProbe nanomanipulators are used for lift out work in FIB and SEM systems, mainly TEM lamella preparation. The ninth generation units run on piezoelectric motors under closed loop control, and the port mounted design keeps clear of other detectors and accessories.
• OmniProbe 350 Cryo lift-out — Oxford Instruments: The cryo lift out option extends OmniProbe lift out to cryogenic samples, including those made by high pressure freezing. A custom probe shaft with a thermally isolated tip is cooled passively from the cryo system cold finger, opening up cryo-TEM and cryo atom probe work.
• Horizon 10k Ion Polisher — Oxford Instruments: The Horizon 10k Ion Polisher uses an argon plasma to etch and prepare flat and cross sectional samples for microscopy. A cooling stage limits thermal damage, and recipe based operation with simple sample mounting keeps preparation repeatable on soft and difficult materials.
• inLux SEM Raman interface — Renishaw: An interface that brings Raman, photoluminescence and cathodoluminescence analysis into a scanning electron microscope chamber. The sample stays still between SEM imaging and Raman collection, so the two data sets are co-located, and the probe retracts with a single click.
• OmniProbe 400 — Oxford Instruments: Now in its ninth generation, this nanomanipulator applies piezo actuation to nanoscale positioning in the FIB and SEM, offering four degrees of freedom in X, Y, Z and R with 4 mm or more of working distance. Nanometre-resolution piezo actuators paired with 10 nm closed-loop encoders deliver precision, linearity and smooth motion, and closed loop control lets the operator navigate to stored positions and move orthogonally at any sample tilt. Motorised concentric rotation and in situ tip changes come as standard, so probe needles can be swapped in under 3 minutes without venting the microscope. Insertion and retraction are non-pneumatic, which is gentle on fragile samples.
• Ultim Max TLE — Oxford Instruments: Ultim Max TLE is the Oxford Instruments flagship silicon drift detector for the TEM, optimised for elemental characterisation at the atomic scale with maximum count rates at the smallest probe sizes. Its performance comes from an optimised sensor shape, a 100 mm2 sensor, windowless construction, an optimised mechanical design and Extreme electronics. The detector is also aimed at biological sample analysis, where it collects data quickly and accurately on beam sensitive samples by maximising the count rate of low energy X-rays. Extreme electronics combined with the X4 pulse processor allow in situ EDS mapping and quantification at elevated temperatures.
• Ultim Max TEM — Oxford Instruments: Ultim Max TEM is the Oxford Instruments silicon drift detector for nanoscale analysis and elemental mapping in the TEM. A low profile 80 mm2 sensor sits closer to the specimen and so collects more X-ray counts under any condition, and combined with windowless construction and Extreme electronics it delivers high performance EDS for 200kV instruments. An increased solid angle and take off angle reduce shadowing by bulky in situ holders, which supports mapping of samples in gas or liquid cells.
• Xplore TEM — Oxford Instruments: Xplore TEM is the Oxford Instruments silicon drift detector aimed at routine work on 120kV and 200kV transmission electron microscopes. It combines an 80 mm2 sensor with a polymer thin window and Extreme electronics for fast, accurate elemental characterisation. The SATW window keeps the detector straightforward to use, and element coverage runs from beryllium to californium.
• TM Series Energy Dispersive X-ray Spectrometer: Element series — Hitachi High-Tech: The Element series are EDX systems for Hitachi's TM series tabletop microscopes, produced by EDAX Instruments. A Si3N4 detector window optimises low energy X-ray transmission for light element analysis, which Hitachi say improves mapping speed and detection limits over a conventional detector window, and a hexagonal support grid raises transmission further. APEX software supplies multi user logins, user configurable windows, customisable reporting, simplified automation, fast mapping, simultaneous collection and review, and spectrum match libraries. The sample configuration shown is in combination with a TM4000 series instrument.
• TM Series Energy Dispersive X-ray Spectrometer: Quantax75 — Hitachi High-Tech: Quantax75 is one of the EDS systems Hitachi offer with the TM4000 series tabletop microscopes, using a built-in detector made by Bruker Nano GmbH. Hitachi note that every detector in this range is of compact design and needs no liquid nitrogen. The system gives local spectra observation at specified points, high speed colourised X-ray mapping, a hypermap function that returns spot analysis, line analysis and mapping results from a single acquisition, and live deconvolution so that overlapping peaks are separated and mapped in real time.
• TM Series Energy Dispersive X-ray Spectrometers: AZtec Series — Hitachi High-Tech: The AZtec series gives the TM series tabletop microscopes a choice of EDS systems, with built-in detectors made by Oxford Instruments and an energy resolution of 129 eV (Mn-Ka) available in all classes. Hitachi list three configurations: AZtecOneXplore as standard, AZtecLiveOneXplore with the live EDS function, and AZtecLiveLite as the multi-featured analysis instrument. The TruMap feature separates multi element spectra and subtracts background in real time so that element maps are free of contamination from overlapping peaks, while pile-up correction and TruQ technologies support high throughput analysis. AZtecLiveLite adds large area mapping and particle analysis through a motorised stage.

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