Brand: Oxford Instruments | Category: Nanotechnology
C-Swift+ is a high speed entry level electron backscatter diffraction detector for routine materials analysis and high throughput characterisation. It uses a customised CMOS sensor with fibre optics, and can trade speed for pattern quality on complex multi phase samples.
| Parameter | Value |
|---|---|
| Indexing speed guaranteed | greater than 2000 pps using only 8 nA beam current |
| Pattern resolution at maximum speed | 156 x 128 pixels |
| Specification | 622 x 512 pixel patterns at speeds up to 250 pps |
| Angular precision | below 0.05° |
| Specification | Optional integrated forescatter detectors |
Contact Vvon Technologies Limited, Bangladesh's authorised distributor for Oxford Instruments.
Phone: +880 1711-738207 | Email: info@vvon.com.bd