Brand: Oxford Instruments | Category: Nanotechnology
Xplore TEM is the Oxford Instruments silicon drift detector aimed at routine work on 120kV and 200kV transmission electron microscopes. It combines an 80 mm2 sensor with a polymer thin window and Extreme electronics for fast, accurate elemental characterisation. The SATW window keeps the detector straightforward to use, and element coverage runs from beryllium to californium.
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The Element series are EDX systems for Hitachi's TM series tabletop microscopes, produced by EDAX Instruments. A Si3N4 detector window optimises low energy X-ray transmission for light element analysis, which Hitachi say improves mapping speed and detection limits over a conventional detector window, and a hexagonal support grid raises transmission further. APEX software supplies multi user logins, user configurable windows, customisable reporting, simplified automation, fast mapping, simultaneous collection and review, and spectrum match libraries. The sample configuration shown is in combination with a TM4000 series instrument.
Ultim Max TEM is the Oxford Instruments silicon drift detector for nanoscale analysis and elemental mapping in the TEM. A low profile 80 mm2 sensor sits closer to the specimen and so collects more X-ray counts under any condition, and combined with windowless construction and Extreme electronics it delivers high performance EDS for 200kV instruments. An increased solid angle and take off angle reduce shadowing by bulky in situ holders, which supports mapping of samples in gas or liquid cells.
Quantax75 is one of the EDS systems Hitachi offer with the TM4000 series tabletop microscopes, using a built-in detector made by Bruker Nano GmbH. Hitachi note that every detector in this range is of compact design and needs no liquid nitrogen. The system gives local spectra observation at specified points, high speed colourised X-ray mapping, a hypermap function that returns spot analysis, line analysis and mapping results from a single acquisition, and live deconvolution so that overlapping peaks are separated and mapped in real time.