Brand: Oxford Instruments | Category: Nanotechnology
Unity is a combined backscattered electron and X-ray detector for the SEM. Both sensor types sit in one package directly beneath the pole piece, which raises X-ray sensitivity and removes the shadowing that affects conventional detectors on rough and unpolished samples.
| Parameter | Value |
|---|---|
| Spatial resolution | below 10 nm when combined with a high resolution FEG-SEM |
| Specification | X-ray detection sensitivity and speed improved by at least 10 times over conventional EDS |
| Specification | Acquires SE, BSE, BEX and EDS data simultaneously in the same scan |
| Specification | Entire 12 mm2 stub analysed in under 20 minutes |
| Specification | Dual X-ray sensors positioned above the sample to remove shadowing |
Contact Vvon Technologies Limited about Oxford Instruments equipment requirements in Bangladesh.
Phone: +880 1711-738207 | Email: info@vvon.com.bd
Symmetry S3 is an all in one electron backscatter diffraction detector built on a CMOS sensor with lens free fibre optic coupling. It combines high indexing speed with the sensitivity needed for low energy and low current work, and the detector tilt is controlled from software.
XploreCompact is an energy dispersive X-ray detector sized to fit inside the outer casing of a table top microscope with no cut outs. It carries the same detector technology as the larger Ultim Max range, bringing AZtecLive real time chemical imaging to benchtop SEMs.
C-Nano+ is an entry level electron backscatter diffraction detector using a customised CMOS sensor. Its high pixel resolution suits detailed strain analysis, and the lens free fibre optic design gives the sensitivity needed for beam sensitive and nanocrystalline materials.