Atomic Force & Scanning Probe Microscopy in Bangladesh

Atomic Force & Scanning Probe Microscopy from Nanosurf and Hitachi High-Tech, supplied, installed and supported in Bangladesh by Vvon Technologies.

26 products from 3 manufacturers: Nanosurf, Hitachi High-Tech, Oxford Instruments.

Find the right starting point

Choose an AFM for your samples and measurement task

For a university or research laboratory in Bangladesh, begin with the result you need: surface topography, roughness, local forces or an electrical property. Then define the specimen, measurement environment and users. These Nanosurf models offer three starting points within the wider catalogue; compare the complete proposed configuration rather than the microscope name alone.

Teaching and basic AFM measurements

NaioAFM combines the scan head, controller and vibration isolation in a compact teaching system. It avoids manual laser alignment. Match its available modes and sample limits to your practical classes or basic research before selecting probes and teaching specimens.

Explore NaioAFM

Compact research in air or liquid

CoreAFM combines the scanner, sample stage, camera and vibration isolation in one research instrument. It supports air and liquid measurements, with optional modes and accessories. Identify the holders, probes and property measurements your research actually requires.

Explore CoreAFM

Advanced research and optical integration

DriveAFM is a tip-scanning research platform with CleanDrive photothermal cantilever excitation. It can work independently or with an inverted optical microscope. Confirm the required measurement modes, compatible microscope stand and environmental options for your sample workflow.

Explore DriveAFM

What to include in your enquiry

• Describe the specimens, dimensions, mounting method and required results; distinguish the area to scan from the overall sample size.
• State whether measurements are in air, liquid or a controlled environment, and identify any existing optical microscope or sample handling equipment.
• Request an itemised list of included modes, probes, holders, calibration references, software and optional modules; verify compatibility for the proposed configuration.
• Review the room's vibration, acoustic and temperature conditions against the manufacturer's requirements. Agree training, example-sample measurements and acceptance criteria in the quotation.

Discuss your requirements

Compare AFM configurations for your laboratory

Compare the measurements AFM and SEM can provide

Products

• DriveAFM — Nanosurf: A tip-scanning research atomic force microscope for work in air and in liquid, from single molecules and virus capsids to 2D materials and semiconductors. CleanDrive photothermal cantilever excitation keeps operation stable in liquid and enables WaveMode off-resonance imaging.
• FlexAFM — Nanosurf: A mid-range tip-scanning research AFM that can be run stand-alone, on an inverted optical microscope or inside a glovebox. It handles large samples and takes a wide set of sample holders and add-ons, and its accessories carry over to the DriveAFM on upgrade.
• CoreAFM — Nanosurf: A compact all-in-one research AFM that brings the scanner, XYZ sample stage, camera, active vibration table and airflow shielding into a single unit. It runs in air and in liquid and can be extended with more than 30 optional modes and functions as the work changes.
• Alphacen 300 Flex — Nanosurf: An industrial AFM built around the Flex-Mount tip-scanning head for samples that are too large or too heavy for a normal microscope. A dedicated acoustic enclosure cuts external noise, and extra translation or rotation axes can be added for awkward geometries.
• Alphacen 300 Drive — Nanosurf: An AFM metrology system for 300 mm wafers, aimed at Angstrom level surface roughness and dimensional measurement in semiconductor quality control. WaveMode photothermal off-resonance imaging raises the line rate while holding tip sharpness, and wafer edge and sidewall inspection is supported.
• LensAFM — Nanosurf: An AFM that mounts on the objective turret of an upright optical microscope or 3D profilometer, so a region found optically can be measured at nanometre resolution by rotating the turret. It returns 3D topography and can also map electrical, magnetic and mechanical properties.
• Nanite — Nanosurf: One of the smallest AFM scan heads Nanosurf builds, made to be integrated into custom stages, production lines or existing setups. It measures sub-nanometre surface roughness on workpieces that cannot be cut down, including concave and curved surfaces.
• Flex-Mount — Nanosurf: The FlexAFM research scan head in a mountable form, made to be attached to a large motorised translation stage or to a customer stage. The tip-scanning design keeps performance on samples whose weight and size would defeat a sample-scanning instrument, including curved parts.
• NaioAFM — Nanosurf: An all-in-one entry level AFM for teaching and basic research on small samples, combining scan head, controller, XY table, airflow shielding and vibration isolation in one unit. No laser alignment is needed, so a first measurement can be made within minutes of unpacking.
• NaioSTM — Nanosurf: A tabletop scanning tunnelling microscope with scan head and controller in one instrument, widely used for teaching. The very short mechanical loop gives enough stability to reach atomic resolution on HOPG in an ordinary classroom, and tips are simply cut from Pt/Ir wire.
• Industrial AFM Solutions — Nanosurf: Bespoke AFM systems engineered around a customer sample and measurement requirement, using mountable FlexAFM or DriveAFM scan heads on purpose-built stages. They are used for sub-nanometre characterisation of polished concave and convex glass, large optics and production quality control.
• AFM Glovebox Workstation — Nanosurf: A turn-key package that integrates a FlexAFM or DriveAFM into a high performance glovebox for air sensitive samples. The table, frame and vibration damping are reinforced to hold AFM performance against glovebox pump noise, and the instrument is driven from software outside the box.
• Multifunctional Probe Microscopy Platform AFM100 series — Hitachi High-Tech: The AFM100 Series is the Hitachi probe microscopy platform, made up of the AFM100 and AFM100 Plus. It covers contact, dynamic force, phase, friction and sampling intelligent scan modes, and can operate in air, in liquid and at raised temperature.
• Atomic Force Microscope AFM5500MII — Hitachi High-Tech: The AFM5500MII is an atomic force microscope with a fully addressable 100 mm stage, aimed at medium sized samples. Automated stage addressing and cantilever exchange support unattended measurement and correlation of the same location between AFM and SEM.
• Cypher S — Oxford Instruments: Asylum Research's ultra high performance research AFM, built on the small, stiff Cypher scanner. Published deflection noise sits below 15 pm and scanning runs up to 40 times faster than conventional instruments. The full range of electrical, mechanical and functional imaging modes is available, which suits work on 2D materials and on piezoelectric and ferroelectric samples.
• Cypher ES — Oxford Instruments: Oxford Instruments describe the Cypher ES as the first AFM engineered specifically for exceptional environmental control. A fully sealed sample chamber sits at its centre, with modular options for operation in controlled gases or in liquid, sample heating and cooling, humidity control and electrochemistry. It shares the Cypher platform with the Cypher S, Cypher L and Cypher VRS1250.
• Cypher L — Oxford Instruments: The most accessible entry point into the Cypher platform, giving high resolution core imaging from the start. Oxford Instruments publish an upgrade path from the Cypher L to the more advanced Cypher models, so a laboratory can begin with core imaging and extend the instrument as the work grows.
• Cypher VRS1250 — Oxford Instruments: Oxford Instruments publish the Cypher VRS1250 as the first and only full featured video rate AFM. Images are captured at up to 45 frames per second while the versatility of the Cypher platform is retained.
• Vero S Interferometric AFM — Oxford Instruments: The standard ambient configuration of Asylum Research's next generation Vero AFMs. Rather than inferring motion from cantilever angle, the Vero measures true tip displacement using Quadrature Phase Differential Interferometry, or QPDI. The Vero platform was named a 2024 R&D 100 award winner.
• Vero ES Interferometric AFM — Oxford Instruments: The environmental control configuration of the Vero AFM line, measuring true tip displacement by Quadrature Phase Differential Interferometry (QPDI). Detection noise falls by up to ten times on many cantilevers and imaging runs 10 to 100 times faster than typical AFMs. Sample temperature options cover 0 to 250 C where heating alone is needed, or 0 to 120 C where both heating and cooling are required.
• Vero VRS1250 Interferometric AFM — Oxford Instruments: This model carries all three of Asylum Research's most advanced AFM technologies at once: Quadrature Phase Differential Interferometry (QPDI), video rate speed imaging and blueDrive photothermal excitation. Line rates reach 1250 lines per second and imaging reaches 45 frames per second. Detection noise is cut by up to ten times or more on many cantilevers.
• Jupiter Discovery AFM — Oxford Instruments: A large sample research AFM that pairs best in class performance with a workflow built for everyday use. Ultra high resolution is held at scan rates 5 to 20 times faster than other AFMs. Pre-mounted probes, a side view camera and the exclusive FFM Topography imaging mode with Autopilot cut the setup work before a measurement, and the system is configurable across a wide range of research needs.
• MFP-3D Origin AFM — Oxford Instruments: The entry level member of the MFP-3D family, marking where Asylum Research performance and quality meet an accessible specification. XY scan range is 120 um with 15 um of Z travel, and a 40 um Z range is available as an option. Large samples, most imaging modes and many of the family accessories are supported, and samples can be heated to 275 C.
• MFP-3D Origin+ AFM — Oxford Instruments: The more capable member of the MFP-3D family, described by Oxford Instruments as an extremely versatile and high performance research AFM ready for almost any field of research. Published scan range is 120 um in XY with 15 um in Z, and a 40 um Z range is available as an option.
• MFP-3D-BIO AFM — Oxford Instruments: The MFP-3D built for bioscience, integrating AFM with optical microscopy on an inverted stand without compromising imaging resolution, force measurement performance or application versatility. Z range is 15 um as standard with a 40 um extended option, and deflection noise is typically below 8 pm against a guaranteed figure below 20 pm. It runs alongside brightfield, phase contrast, epifluorescence, confocal, TIRF, FRET, FCS and FRAP optical techniques.
• Stage Solutions — Nanosurf: Nanosurf lists Stage Solutions among its industrial AFM offerings as customised stage systems built around a customer's requirements. The published page names manual and motorised stages with up to five axes, safety integration, customised AE, software integration and automation. Applications given are production scale quality control and production scale research and development, sub-nanometre surface characterisation of highly polished concave and convex glass, and large optics for short wavelength applications and synchrotron mirrored surfaces.

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