Brand: Oxford Instruments | Category: Nanotechnology
An analysis package for AFM data that reads both Ergo and Igor files from Jupiter family instruments. The standard level provides extensive tools to correct, normalise and denoise measured data, characterises surface and section data with ISO standard roughness, step height and distance measurement and histograms, and lets users build their own processing recipes. The advanced level adds batch processing and automation, statistics reports across datasets, critical dimension and trench analysis with cantilever tip deconvolution, image stitching and particle analysis.
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