Choosing an atomic force microscope.

Choose an AFM around the property you need to measure, the sample and the measurement environment. Surface topography, electrical response, force measurements and production metrology can need different probes, modes and accessories. Compare scan range, noise, sample access, optical integration and the evidence needed to accept the measurement; several configurations may fit.

What actually drives the decision

• Sample size and weight: Give sample dimensions, mass, surface geometry and whether it can be sectioned. A tip-scanning design can help with large or heavy samples, but stage capacity, head clearance, mounting and access to the region of interest still need checking.
• Environment of the measurement: Specify liquid composition, temperature and any glovebox or environmental control. Photothermal excitation can reduce spurious resonances and improve dynamic-mode operation in liquid; it is not the only way to perform liquid AFM. Confirm compatible probes, cells and the required measurement mode.
• What else it must work with: An AFM that has to combine with an inverted optical microscope, mount on an objective turret, or integrate into an existing stage is a different instrument from a standalone system.
• Research breadth versus a fixed task: A shared instrument may need several modes and user workflows. A repeated production measurement needs the appropriate mode, automation and repeatability evidence. List the essential tasks first, then separate useful future options from the initial configuration.
• Laboratory noise: Assess vibration, acoustic noise and temperature against the required measurement. Isolation may be integrated or supplied separately; an enclosure and vibration isolator address different disturbances. Confirm whether the proposed arrangement meets the manufacturer's site limits.
• Upgrade path: If future upgrades matter, list the existing probes, holders, stages, controllers and software to retain. Ask the manufacturer to confirm compatibility and the additional items required for the specific proposed upgrade.

What each option is built for

CoreAFM (Nanosurf)

Best suited to: A single instrument that has to cover a wide range of work for a whole group.

Typically runs in: University research groups and central facilities seeking a compact platform for configured topography and other AFM measurements.

• All-in-one: scanner, XYZ sample stage, camera, active vibration table and airflow shielding in one unit
• Runs in air and in liquid
• Extendable with more than 30 optional modes and functions
• Integrated active vibration isolation reduces separate equipment needs

Confirm before selecting: Confirm the required modes, probes and liquid or environmental accessories. Review bench loading, temperature and acoustic/vibration conditions even though active isolation is integrated.

Full specification for CoreAFM

FlexAFM (Nanosurf)

Best suited to: Work that has to run standalone, on an inverted optical microscope, or inside a glovebox.

Typically runs in: Groups combining AFM with optical techniques, and laboratories working in controlled atmospheres.

• Mid-range tip-scanning research AFM
• Runs standalone, on an inverted optical microscope, or inside a glovebox
• Handles large samples
• Wide set of sample holders and add-ons
• An accessory range with model-specific upgrade compatibility to confirm

Confirm before selecting: Confirm head clearance, mounting, optical access and the required modes for the host microscope or glovebox. Specify isolation and check each existing accessory before planning a DriveAFM upgrade.

Full specification for FlexAFM

DriveAFM (Nanosurf)

Best suited to: Research-grade work in air and liquid, from single molecules to 2D materials.

Typically runs in: Research groups working on single molecules, virus capsids, 2D materials and semiconductors.

• Tip-scanning research AFM for air and liquid
• CleanDrive photothermal excitation improves cantilever actuation in liquid
• Supports WaveMode off-resonance imaging
• Suited to soft biological and delicate 2D samples

Confirm before selecting: A low-vibration, low-noise laboratory environment appropriate to research-grade measurement.

Full specification for DriveAFM

LensAFM (Nanosurf)

Best suited to: Measuring a region you have already located optically, without moving the sample.

Typically runs in: Laboratories with an existing upright optical microscope or 3D profilometer they want to extend.

• Mounts on the objective turret of an upright optical microscope or 3D profilometer
• Rotate the turret to measure an optically located region at nanometre resolution
• Returns 3D topography
• Combines optical location with AFM surface measurement in a compatible setup

Confirm before selecting: Confirm the exact microscope or profilometer, turret mounting, clearances and working distances. Request the measurement modes, probes and controller supplied; do not assume all modes from other AFM platforms are available.

Full specification for LensAFM

Nanite (Nanosurf)

Best suited to: Integration into a custom stage, production line or existing setup.

Typically runs in: Industrial users measuring workpieces in place, and groups building AFM into a larger instrument.

• One of the smallest AFM scan heads Nanosurf builds
• Designed for integration into custom stages and production lines
• Measures sub-nanometre surface roughness on workpieces that cannot be cut down
• Handles concave and curved surfaces

Confirm before selecting: Provide host-stage drawings, sample geometry, automation and measurement requirements. Define integration engineering, control interfaces and acceptance evidence in the proposed scope.

Full specification for Nanite

Alphacen 300 Flex (Nanosurf)

Best suited to: Samples too large or too heavy for a normal microscope stage.

Typically runs in: Industrial laboratories and quality departments measuring large components and awkward geometries.

• Industrial AFM built around the Flex-Mount tip-scanning head
• Dedicated acoustic enclosure cuts external noise
• Extra translation or rotation axes can be added for awkward geometries
• Handles samples that will not fit a conventional stage

Confirm before selecting: Floor space for the enclosure and a stable industrial environment.

Full specification for Alphacen 300 Flex

Alphacen 300 Drive (Nanosurf)

Best suited to: 300 mm wafer metrology in semiconductor quality control.

Typically runs in: Semiconductor quality control and advanced metrology laboratories.

• AFM metrology system for 300 mm wafers
• Aimed at Ångström-level surface roughness and dimensional measurement
• WaveMode photothermal off-resonance imaging for fast, controlled tip–sample interaction
• Wafer measurement and handling arrangements to specify for the process

Confirm before selecting: Confirm wafer size, edge access, handling, surface roughness range and throughput at the required measurement quality. Specify probes, calibration, site conditions and acceptance tests; tip wear still depends on the sample and settings.

Full specification for Alphacen 300 Drive

Include in your enquiry

• Request the proposed head, controller, software, modes and accessories as a defined configuration
• Agree a site review covering vibration, acoustic noise and temperature stability
• Specify representative samples and repeatability or resolution criteria for acceptance
• Confirm installation and training scope, including probe selection and mode setup
• Check probe, holder and accessory compatibility for the exact model
• Request warranty terms, maintenance options and service responsibilities in writing

Send the sample dimensions and material, target property, scan area, measurement environment and any host microscope or stage. Include required throughput and acceptance criteria. These inputs let us discuss a configuration and identify the probes, accessories, integration and training to include in the quotation.

Compare the complete AFM measurement setup

An AFM family name does not define its measurement modes or sample environment. Ask each proposal to identify the configuration and demonstration conditions for the work you need.

DriveAFM

Compare the selected scanner, excitation and measurement modes with representative samples.

Confirm in the offer: List probes, sample holders, liquid options and environmental controls explicitly.

Explore DriveAFM

FlexAFM

Assess the flexible configuration against the required experiment and integration constraints.

Confirm in the offer: Confirm scanner, controller, optical access and any glovebox or liquid arrangement.

Explore FlexAFM

AFM versus SEM

Use the required surface, imaging and compositional outputs to decide which technique belongs in the workflow.

Confirm in the offer: Do not substitute one technique for another without checking the measurement and sample requirements.

Explore AFM versus SEM

Prepare a comparable quotation

• Sample type, dimensions, environment and measurements
• Modes, probes, scanner, software and included accessories
• Demonstration, installation and application-training criteria

Reference information

Discuss your shortlist