Brand: Oxford Instruments | Category: Nanotechnology
Ultim Max TEM is the Oxford Instruments silicon drift detector for nanoscale analysis and elemental mapping in the TEM. A low profile 80 mm2 sensor sits closer to the specimen and so collects more X-ray counts under any condition, and combined with windowless construction and Extreme electronics it delivers high performance EDS for 200kV instruments. An increased solid angle and take off angle reduce shadowing by bulky in situ holders, which supports mapping of samples in gas or liquid cells.
Contact Vvon Technologies Limited, Bangladesh's authorised distributor for Oxford Instruments.
Phone: +880 1711-738207 | Email: info@vvon.com.bd