Brand: Oxford Instruments | Category: Nanotechnology
A large sample research AFM that pairs best in class performance with a workflow built for everyday use. Ultra high resolution is held at scan rates 5 to 20 times faster than other AFMs. Pre-mounted probes, a side view camera and the exclusive FFM Topography imaging mode with Autopilot cut the setup work before a measurement, and the system is configurable across a wide range of research needs.
Contact Vvon Technologies Limited, Bangladesh's authorised distributor for Oxford Instruments.
Phone: +880 1711-738207 | Email: info@vvon.com.bd