Hitachi High-Tech in Bangladesh

Vvon Technologies Limited supplies, installs and services Hitachi High-Tech equipment across Bangladesh. 57 products are catalogued across Scientific & Laboratory Equipment, Nanotechnology.

Categories

• Electron Microscopy & Microanalysis (25)
• Electron Microscopy (16)
• Laboratory Instruments (7)
• Microscopy & Imaging Systems (4)
• Atomic Force & Scanning Probe Microscopy (2)
• Instrument Software (2)
• Thin Film Deposition (1)

Products

• Tabletop Microscope TM4000PlusII/TM4000II: The TM4000II and TM4000PlusII are benchtop scanning electron microscopes for fast imaging with little sample preparation. They take specimens up to 80 mm across using backscattered electron detection, with secondary electron and mixed signal modes on the Plus model.
• Tabletop Microscope TM4000PlusIII/TM4000III: The TM4000III and TM4000PlusIII are the newest benchtop scanning electron microscopes in the Hitachi TM range. They image conductive and non conductive samples using a charge up reduction mode, and take specimens up to 80 mm diameter and 50 mm thick.
• Scanning Electron Microscope FlexSEM 1000 II: The FlexSEM 1000 II is a variable pressure scanning electron microscope with a tungsten filament source. It images uncoated and outgassing samples in a controlled pressure chamber, and supports energy dispersive X-ray analysis and STEM specimen holders.
• Scanning Electron Microscopes SU3800/SU3900: The SU3800 and SU3900 are variable pressure scanning electron microscopes with a five axis motorised stage and automated functions. The SU3900 carries a larger multipurpose chamber that takes specimens up to 300 mm diameter for bulky industrial samples.
• High Resolution Schottky Scanning Electron Microscope SU3900SE/SE Plus SU3800SE/SE Plus: The SE Series brings Schottky field emission performance to the SU3800 and SU3900 platforms. Four models cover standard and extra large chambers, with SE Plus versions adding deceleration mode and dedicated low energy secondary electron detection.
• Schottky Field Emission Scanning Electron Microscope SU5000: The SU5000 is a Schottky field emission scanning electron microscope with an out lens objective, moving between high vacuum and variable pressure operation. Its EM Wizard interface guides imaging conditions and a drawer type stage accepts large specimens.
• Ultrahigh-Resolution Schottky Scanning Electron Microscope SU7000: The SU7000 is a Schottky field emission scanning electron microscope that collects several secondary and backscattered signals at once. Up to six channels can be displayed and stored together, and an optional variable pressure mode widens the range of samples.
• Ultrahigh-Resolution Scanning Electron Microscope SU8600: The SU8600 is a cold field emission scanning electron microscope for ultrahigh resolution imaging. An upper detector with ExB filter mixes secondary and backscattered signals, and optional detectors add cathodoluminescence and STEM capability.
• Ultrahigh-Resolution Schottky Scanning Electron Microscope SU8700: The SU8700 is a Schottky field emission scanning electron microscope offering high probe current for fast microanalysis alongside ultrahigh resolution imaging. Low landing voltage operation without stage bias suits beam sensitive specimens.
• Ultrahigh-Resolution Scanning Electron Microscope SU9600: The SU9600 is the flagship Hitachi cold field emission scanning electron microscope, built for subnanometre observation. An in lens objective and ExB detection give good signal to noise at low probe current, for semiconductor devices and advanced materials.
• Field Emission Transmission Electron Microscope HF5000: The HF5000 is a 200 kV aberration corrected TEM and STEM with a cold field emission source. A single objective lens configuration combines high specimen tilt with large solid angle EDX detection, for imaging and analysis at the atomic scale.
• Transmission Electron Microscope HT7800 Series: The HT7800 Series is a 120 kV transmission electron microscope that automates routine alignment and setting. Three models trade maximum magnification against stage tilt range, covering work from life science sectioning through to materials development.
• Focused Ion and Electron Beam System Ethos NX5000: The Ethos NX5000 combines a field emission SEM column with a gallium focused ion beam for nanoscale processing and imaging. A microsampling system with orientation control prepares uniform TEM lamellas, and a triple beam option reduces milling artefacts.
• Real-time 3D Analytical FIB-SEM NX9000: The NX9000 arranges its SEM and FIB columns orthogonally so cross sections are imaged at normal incidence. This removes foreshortening during serial sectioning and allows 3D EDS and 3D EBSD to be collected without moving the stage.
• Auto Capture for Array Tomography ACAT: ACAT is an automated image acquisition option for serial section analysis on Hitachi field emission SEMs. It aligns and captures a chosen region of interest across many consecutive sections, correcting for rotation, compression and tears so array tomography runs without operator input.
• MirrorCLEM System for Correlative Light and Electron Microscopy: MirrorCLEM correlates specimens between optical and electron microscopes. A specimen imaged on any light microscope is transferred to the Hitachi SEM stage, where the optical image acts as an anchor map that drives the stage to a chosen region and overlays both images in real time.
• 3D Visualization Software Hitachi map 3D: Hitachi map 3D builds a three dimensional model from the four signals of the segmented backscattered electron detector, with no sample tilting and no manual collection of consecutive images. It measures height, area, volume and ISO compliant surface roughness, and produces reports.
• Automated Material Identification and Classification System (AMICS): AMICS automates mineral and material phase classification on Hitachi SEM platforms. It runs large area mapping and places energy dispersive spectrometry points automatically, then classifies the spectra to produce quantified mineral or material maps for mining and materials work.
• Multifunctional Probe Microscopy Platform AFM100 series: The AFM100 Series is the Hitachi probe microscopy platform, made up of the AFM100 and AFM100 Plus. It covers contact, dynamic force, phase, friction and sampling intelligent scan modes, and can operate in air, in liquid and at raised temperature.
• Atomic Force Microscope AFM5500MII: The AFM5500MII is an atomic force microscope with a fully addressable 100 mm stage, aimed at medium sized samples. Automated stage addressing and cantilever exchange support unattended measurement and correlation of the same location between AFM and SEM.
• Nanoscale Device Characteristics Analysis System Nano-Prober NP8000: The NP8000 Nano-Prober is a SEM based probing system for electrical characterisation of devices at 5 nm nodes and beyond. It supports electron beam absorbed current imaging, pulsed IV measurement and a temperature controlled stage inside the vacuum chamber.
• FIB Micro-sampling System: The Micro-sampling System extracts a small pillar of material from a chosen point on a wafer using the ion beam inside the vacuum chamber of a FIB system. The extracted sample is then trimmed and transferred for analysis by TEM or STEM.
• Ion Milling System ArBlade 5000: The ArBlade 5000 is a broad argon ion beam milling system that prepares cross sections and flat milled surfaces for electron microscopy. Intermittent beam irradiation and a swinging stage produce clean faces across a wide range of materials.
• Ion Milling System IM4000II: The IM4000II is an argon ion milling system that carries out both cross section milling and flat milling in one instrument. Options for cooled temperature control and an air protection holder allow preparation of heat sensitive and air sensitive specimens.
• MC1000 Ion Sputter Coater: The MC1000 is a magnetron ion sputter coater that deposits a thin conductive metal layer on samples before SEM observation. Platinum, gold and their palladium alloys can be applied, with the coating thickness set from the touch screen control.
• Sample Cleaner ZONESEMII: The ZONESEMII is a benchtop sample cleaner that removes hydrocarbon contamination from SEM specimens and holders using vacuum controlled UV irradiation and activated oxygen. It also acts as a vacuum store to prevent holder outgassing.
• Sample Cleaner ZONETEM II: The ZONETEM II is a desktop sample cleaner for TEM specimens. It uses vacuum controlled UV irradiation to remove hydrocarbon contamination from the sample surface before imaging, without the use of chemicals, supply gases or reagents.
• Tabletop Microscope TM4000PlusII/TM4000II: The TM4000II and TM4000PlusII are benchtop scanning electron microscopes for fast imaging with little sample preparation. They take specimens up to 80 mm across using backscattered electron detection, with secondary electron and mixed signal modes on the Plus model.
• Tabletop Microscope TM4000PlusIII/TM4000III: The TM4000III and TM4000PlusIII are the newest benchtop scanning electron microscopes in the Hitachi TM range. They image conductive and non conductive samples using a charge up reduction mode, and take specimens up to 80 mm diameter and 50 mm thick.
• Scanning Electron Microscope FlexSEM 1000 II: The FlexSEM 1000 II is a variable pressure scanning electron microscope with a tungsten filament source. It images uncoated and outgassing samples in a controlled pressure chamber, and supports energy dispersive X-ray analysis and STEM specimen holders.
• Scanning Electron Microscopes SU3800/SU3900: The SU3800 and SU3900 are variable pressure scanning electron microscopes with a five axis motorised stage and automated functions. The SU3900 carries a larger multipurpose chamber that takes specimens up to 300 mm diameter for bulky industrial samples.
• High Resolution Schottky Scanning Electron Microscope SU3900SE/SE Plus SU3800SE/SE Plus: The SE Series brings Schottky field emission performance to the SU3800 and SU3900 platforms. Four models cover standard and extra large chambers, with SE Plus versions adding deceleration mode and dedicated low energy secondary electron detection.
• Schottky Field Emission Scanning Electron Microscope SU5000: The SU5000 is a Schottky field emission scanning electron microscope with an out lens objective, moving between high vacuum and variable pressure operation. Its EM Wizard interface guides imaging conditions and a drawer type stage accepts large specimens.
• Ultrahigh-Resolution Schottky Scanning Electron Microscope SU7000: The SU7000 is a Schottky field emission scanning electron microscope that collects several secondary and backscattered signals at once. Up to six channels can be displayed and stored together, and an optional variable pressure mode widens the range of samples.
• Ultrahigh-Resolution Scanning Electron Microscope SU8600: The SU8600 is a cold field emission scanning electron microscope for ultrahigh resolution imaging. An upper detector with ExB filter mixes secondary and backscattered signals, and optional detectors add cathodoluminescence and STEM capability.
• Ultrahigh-Resolution Schottky Scanning Electron Microscope SU8700: The SU8700 is a Schottky field emission scanning electron microscope offering high probe current for fast microanalysis alongside ultrahigh resolution imaging. Low landing voltage operation without stage bias suits beam sensitive specimens.
• Ultrahigh-Resolution Scanning Electron Microscope SU9600: The SU9600 is the flagship Hitachi cold field emission scanning electron microscope, built for subnanometre observation. An in lens objective and ExB detection give good signal to noise at low probe current, for semiconductor devices and advanced materials.
• Field Emission Transmission Electron Microscope HF5000: The HF5000 is a 200 kV aberration corrected TEM and STEM with a cold field emission source. A single objective lens configuration combines high specimen tilt with large solid angle EDX detection, for imaging and analysis at the atomic scale.
• Transmission Electron Microscope HT7800 Series: The HT7800 Series is a 120 kV transmission electron microscope that automates routine alignment and setting. Three models trade maximum magnification against stage tilt range, covering work from life science sectioning through to materials development.
• Nanoscale Device Characteristics Analysis System Nano-Prober NP8000: The NP8000 Nano-Prober is a SEM based probing system for electrical characterisation of devices at 5 nm nodes and beyond. It supports electron beam absorbed current imaging, pulsed IV measurement and a temperature controlled stage inside the vacuum chamber.
• Focused Ion and Electron Beam System Ethos NX5000: The Ethos NX5000 combines a field emission SEM column with a gallium focused ion beam for nanoscale processing and imaging. A microsampling system with orientation control prepares uniform TEM lamellas, and a triple beam option reduces milling artefacts.
• Real-time 3D Analytical FIB-SEM NX9000: The NX9000 arranges its SEM and FIB columns orthogonally so cross sections are imaged at normal incidence. This removes foreshortening during serial sectioning and allows 3D EDS and 3D EBSD to be collected without moving the stage.
• FIB Micro-sampling System: The Micro-sampling System extracts a small pillar of material from a chosen point on a wafer using the ion beam inside the vacuum chamber of a FIB system. The extracted sample is then trimmed and transferred for analysis by TEM or STEM.
• Ion Milling System ArBlade 5000: The ArBlade 5000 is a broad argon ion beam milling system that prepares cross sections and flat milled surfaces for electron microscopy. Intermittent beam irradiation and a swinging stage produce clean faces across a wide range of materials.
• Ion Milling System IM4000II: The IM4000II is an argon ion milling system that carries out both cross section milling and flat milling in one instrument. Options for cooled temperature control and an air protection holder allow preparation of heat sensitive and air sensitive specimens.
• Sample Cleaner ZONESEMII: The ZONESEMII is a benchtop sample cleaner that removes hydrocarbon contamination from SEM specimens and holders using vacuum controlled UV irradiation and activated oxygen. It also acts as a vacuum store to prevent holder outgassing.
• Sample Cleaner ZONETEM II: The ZONETEM II is a desktop sample cleaner for TEM specimens. It uses vacuum controlled UV irradiation to remove hydrocarbon contamination from the sample surface before imaging, without the use of chemicals, supply gases or reagents.
• Auto Capture for Array Tomography ACAT: ACAT is an automated image acquisition option for serial section analysis on Hitachi field emission SEMs. It aligns and captures a chosen region of interest across many consecutive sections, correcting for rotation, compression and tears so array tomography runs without operator input.
• MirrorCLEM System for Correlative Light and Electron Microscopy: MirrorCLEM correlates specimens between optical and electron microscopes. A specimen imaged on any light microscope is transferred to the Hitachi SEM stage, where the optical image acts as an anchor map that drives the stage to a chosen region and overlays both images in real time.
• TM Series Energy Dispersive X-ray Spectrometer: Element series: The Element series are EDX systems for Hitachi's TM series tabletop microscopes, produced by EDAX Instruments. A Si3N4 detector window optimises low energy X-ray transmission for light element analysis, which Hitachi say improves mapping speed and detection limits over a conventional detector window, and a hexagonal support grid raises transmission further. APEX software supplies multi user logins, user configurable windows, customisable reporting, simplified automation, fast mapping, simultaneous collection and review, and spectrum match libraries. The sample configuration shown is in combination with a TM4000 series instrument.
• TM Series Energy Dispersive X-ray Spectrometer: Quantax75: Quantax75 is one of the EDS systems Hitachi offer with the TM4000 series tabletop microscopes, using a built-in detector made by Bruker Nano GmbH. Hitachi note that every detector in this range is of compact design and needs no liquid nitrogen. The system gives local spectra observation at specified points, high speed colourised X-ray mapping, a hypermap function that returns spot analysis, line analysis and mapping results from a single acquisition, and live deconvolution so that overlapping peaks are separated and mapped in real time.
• TM Series Energy Dispersive X-ray Spectrometers: AZtec Series: The AZtec series gives the TM series tabletop microscopes a choice of EDS systems, with built-in detectors made by Oxford Instruments and an energy resolution of 129 eV (Mn-Ka) available in all classes. Hitachi list three configurations: AZtecOneXplore as standard, AZtecLiveOneXplore with the live EDS function, and AZtecLiveLite as the multi-featured analysis instrument. The TruMap feature separates multi element spectra and subtracts background in real time so that element maps are free of contamination from overlapping peaks, while pile-up correction and TruQ technologies support high throughput analysis. AZtecLiveLite adds large area mapping and particle analysis through a motorised stage.
• MC1000 Ion Sputter Coater: The MC1000 is a magnetron ion sputter coater that deposits a thin conductive metal layer on samples before SEM observation. Platinum, gold and their palladium alloys can be applied, with the coating thickness set from the touch screen control.
• Multifunctional Probe Microscopy Platform AFM100 series: The AFM100 Series is the Hitachi probe microscopy platform, made up of the AFM100 and AFM100 Plus. It covers contact, dynamic force, phase, friction and sampling intelligent scan modes, and can operate in air, in liquid and at raised temperature.
• Atomic Force Microscope AFM5500MII: The AFM5500MII is an atomic force microscope with a fully addressable 100 mm stage, aimed at medium sized samples. Automated stage addressing and cantilever exchange support unattended measurement and correlation of the same location between AFM and SEM.
• 3D Visualization Software Hitachi map 3D: Hitachi map 3D builds a three dimensional model from the four signals of the segmented backscattered electron detector, with no sample tilting and no manual collection of consecutive images. It measures height, area, volume and ISO compliant surface roughness, and produces reports.
• Automated Material Identification and Classification System (AMICS): AMICS automates mineral and material phase classification on Hitachi SEM platforms. It runs large area mapping and places energy dispersive spectrometry points automatically, then classifies the spectra to produce quantified mineral or material maps for mining and materials work.