Brand: Oxford Instruments | Category: Nanotechnology
C-Nano+ is an entry level electron backscatter diffraction detector using a customised CMOS sensor. Its high pixel resolution suits detailed strain analysis, and the lens free fibre optic design gives the sensitivity needed for beam sensitive and nanocrystalline materials.
| Parameter | Value |
|---|---|
| Indexing speed guaranteed | 600 pps using only 3 nA beam current |
| Pattern resolution at maximum speed | 311 x 256 pixels |
| Full resolution patterns | 1244 x 1024 pixels for high resolution EBSD |
| Maximum sensitivity | 900 pps per nA in full resolution mode |
| Specification | Guaranteed sub-pixel distortion giving angular precision better than 0.05° |
Contact Vvon Technologies Limited, Bangladesh's authorised distributor for Oxford Instruments.
Phone: +880 1711-738207 | Email: info@vvon.com.bd