Choosing a scanning electron microscope.

Start an SEM specification with representative samples and the measurements you need from them. Resolution must be considered alongside accelerating voltage, sample preparation, chamber and stage limits, detectors, throughput and operator experience. A demonstration using relevant samples helps establish whether a proposed configuration meets your work before you commit to it.

What actually drives the decision

• What your samples are: Describe conductivity, water or solvent content, outgassing and beam sensitivity. Variable pressure can reduce charging and support some samples containing a little water or oil, but it does not make every wet or sensitive sample suitable. Confirm vacuum compatibility, preparation and any special holder or cooling arrangement.
• How large the samples are: Give sample diameter, height, mass and whether it can be sectioned. Check usable stage travel, tilt clearance and detector access for the offered holder, as well as the maximum chamber dimensions. Large samples may not be accessible over their entire surface.
• The resolution the science actually needs: Specify resolution at the accelerating voltage, detector signal and beam conditions needed for your sample. Both Schottky and cold-field-emission systems can provide sub-nanometre imaging under stated conditions. Compare demonstrated performance and required analysis, rather than selecting by source type or maximum magnification alone.
• Who will operate it: A shared teaching instrument used by many students has different demands from a research instrument with one trained operator. Guided interfaces and low preparation matter more in the first case.
• Whether you need analysis, not just images: EDX, EBSD, STEM and cathodoluminescence require compatible detectors, geometry, software and sample preparation. Ask which options are included and which can be fitted later, with their installation requirements and quoted costs.
• Laboratory services: Check the manufacturer's limits for power, temperature, vibration, electromagnetic interference and other utilities. Include the bench or floor, pump location and access route in the site review, even for a compact instrument. Resolve required preparation before scheduling installation.

What each option is built for

Tabletop Microscope TM4000 Series (Hitachi High-Tech)

Best suited to: Compact imaging for teaching and routine work on compatible prepared or uncoated samples.

Typically runs in: University teaching laboratories, polytechnics and QC teams seeking a compact SEM with a guided workflow and trained operators.

• Benchtop footprint for compact laboratory layouts
• Low-vacuum modes can reduce coating requirements for compatible samples
• Sample holder and stage options to assess against specimen size and access
• Charge-up reduction mode images conductive and non-conductive samples
• Backscattered electron detection, with secondary electron and mixed modes on Plus models

Confirm before selecting: Confirm model-specific sample dimensions, stage clearance, bench loading, pump space and electrical requirements. Check environmental limits and sample compatibility before deciding that the existing room is suitable.

Full specification for Tabletop Microscope TM4000 Series

FlexSEM 1000 II (Hitachi High-Tech)

Best suited to: Compact variable-pressure imaging where reducing coating requirements is useful.

Typically runs in: Materials, life science and environmental laboratories with samples suitable for the offered vacuum and preparation workflow.

• Variable-pressure chamber for compatible uncoated and outgassing samples
• Tungsten filament source
• Optional energy dispersive X-ray analysis
• Specimen holder options to discuss for the intended measurements

Confirm before selecting: Confirm water or solvent content, preparation limits, stage clearance and the detectors or holders included. Review the room and vacuum-system requirements; variable pressure is not unrestricted wet-sample capability.

Full specification for FlexSEM 1000 II

SU3800 / SU3900 (Hitachi High-Tech)

Best suited to: Industrial and bulky samples, including parts that cannot be cut down.

Typically runs in: Industrial laboratories, failure analysis services and research institutes handling large physical specimens.

• Variable pressure operation
• Five-axis motorised stage with automated functions
• SU3900 chamber takes specimens up to 300 mm diameter
• Built for routine work on bulky industrial samples

Confirm before selecting: A dedicated microscope room with floor loading suitable for a large chamber platform.

Full specification for SU3800 / SU3900

SU5000 (Hitachi High-Tech)

Best suited to: General research needing field-emission quality across varied sample types.

Typically runs in: University central facilities and research institutes serving many disciplines from one instrument.

• Schottky field emission source with an out-lens objective
• Moves between high vacuum and variable pressure operation
• EM Wizard interface guides imaging conditions
• Drawer-type stage accepts large specimens

Confirm before selecting: A prepared microscope room: stable power, controlled temperature, low vibration and low electromagnetic interference.

Full specification for SU5000

SU7000 (Hitachi High-Tech)

Best suited to: Research where several signals must be collected and compared together.

Typically runs in: Multi-user research groups whose work depends on correlating secondary and backscattered information.

• Collects several secondary and backscattered signals simultaneously
• Up to six channels displayed and stored together
• Schottky field emission source
• Optional variable pressure mode widens the sample range

Confirm before selecting: A prepared microscope room with stable services, as for any field-emission instrument.

Full specification for SU7000

SU8600 / SU9600 (Hitachi High-Tech)

Best suited to: Sub-nanometre imaging for semiconductor and advanced materials research.

Typically runs in: National research centres and advanced materials groups where resolution is the object of the work.

• Cold field emission source for ultrahigh-resolution imaging
• SU8600 upper detector with ExB filter mixes secondary and backscattered signals
• SU9600 in-lens objective with ExB detection for good signal-to-noise at low probe current
• Optional cathodoluminescence and STEM capability on the SU8600

Confirm before selecting: A purpose-prepared microscope room with tight control of vibration, temperature and electromagnetic interference.

Full specification for SU8600 / SU9600

Include in your enquiry

• Request the exact model, detectors, stage, vacuum modes and software in the quotation
• Agree a site review against the manufacturer's environmental and utility limits
• Define sample-based demonstrations and measurable acceptance criteria for the specification
• Confirm who installs the instrument and the operator or applications training included
• Specify warranty, maintenance options and the process for obtaining service parts
• Check consumables, detector compatibility and any proposed future upgrades by model

Send your sample material, dimensions, preparation limits, target feature size and required imaging or analysis. Include expected workload and existing laboratory services. We can use these inputs to compare relevant configurations and identify the demonstrations, accessories and site work to request in a quotation.

Compare SEM quotations beyond magnification

Request a configuration that addresses your specimens and measurements. Evaluate microscopy and elemental-analysis requirements together, while pricing each included subsystem clearly.

TM4000III family

Assess the tabletop workflow against sample dimensions, preparation and required image evidence.

Confirm in the offer: Identify the exact variant, detectors and any optional elemental-analysis package.

Explore TM4000III family

FlexSEM 1000 II

Compare the proposed source, vacuum modes, stage and detectors against the same specimens.

Confirm in the offer: Confirm room conditions, utilities, sample preparation and operator training.

Explore FlexSEM 1000 II

SU7000

Evaluate the proposed field-emission configuration using measurements representative of your research.

Confirm in the offer: Separate EDS/EBSD, sample-preparation equipment, environmental work and service from the base microscope.

Explore SU7000

Prepare a comparable quotation

• Representative sample materials, dimensions and measurement goals
• Required images, elemental analysis and acceptance evidence
• Full installation cost, accessories, training and recurring service scope

Reference information

Discuss your shortlist