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Scanning Electron Microscope FlexSEM 1000 II

Brand: Hitachi High-Tech | Category: Scientific & Laboratory Equipment

The FlexSEM 1000 II is a variable pressure scanning electron microscope with a tungsten filament source. It images uncoated and outgassing samples in a controlled pressure chamber, and supports energy dispersive X-ray analysis and STEM specimen holders.

Technical Specifications

ParameterValue
Secondary electron resolution4.0 nm at 20 kV, WD 5 mm, high vacuum mode
Backscattered electron resolution5.0 nm at 20 kV, WD 5 mm, VP mode
Accelerating voltage0.3 kV to 20 kV
Magnification6x to 300,000x image ratio
Variable pressure range6 to 100 Pa in 13 steps
Maximum observable range64 mm diameter combined with rotation

View on manufacturer website

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Contact Vvon Technologies Limited, Bangladesh's authorised distributor for Hitachi High-Tech.

Phone: +880 1711-738207 | Email: info@vvon.com.bd

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