Brand: Denton Vacuum | Category: Nanotechnology
An etching tool for semiconductor failure analysis, thin film profiling and delayering. It combines ion beam etch, reactive ion beam etch and chemically assisted ion beam etch so that layers of mixed composition can be removed at matched rates.
| Parameter | Value |
|---|---|
| Etch technologies | IBE, reactive IBE and chemically assisted IBE |
| Specification | Integrated SIMS package for endpoint control and defect location |
| Specification | ESD compliant and fully computer controlled |
| Applications | semiconductor failure analysis, delayering, yield improvement, reverse engineering, microdisplay failure analysis |
Contact Vvon Technologies Limited, Bangladesh's authorised distributor for Denton Vacuum.
Phone: +880 1711-738207 | Email: info@vvon.com.bd