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Nanoscale Device Characteristics Analysis System Nano-Prober NP8000

Brand: Hitachi High-Tech | Category: Scientific & Laboratory Equipment

The NP8000 Nano-Prober is a SEM based probing system for electrical characterisation of devices at 5 nm nodes and beyond. It supports electron beam absorbed current imaging, pulsed IV measurement and a temperature controlled stage inside the vacuum chamber.

Technical Specifications

ParameterValue
Electron gunSchottky emission source
Accelerating voltage0.1 kV to 30 kV
Probe stagepiezoelectric, fine stroke 5 µm in X and Y
Probe coarse stroke3 mm X, 5 mm Y
Specimen size15 mm x 15 mm or smaller, 1 mm thick or less
Image shift±75 µm at 1.0 kV, WD 5 mm

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Contact Vvon Technologies Limited, Bangladesh's authorised distributor for Hitachi High-Tech.

Phone: +880 1711-738207 | Email: info@vvon.com.bd

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