Brand: J.A. Woollam | Category: Nanotechnology
The theta-SE is a benchtop mapping ellipsometer for checking thin film uniformity across wafers up to 300 mm. A patented dual theta rotation stage, focused beam and camera alignment keep the footprint close to the wafer size while producing thickness and optical constant maps.
| Parameter | Value |
|---|---|
| Mapping coverage | 300 mm diameter |
| Spectral range | 400 to 1000 nm |
| Number of wavelengths | 190 |
| Spot size | nominal 250 x 600 um on sample |
| Angle of incidence | 65 degrees fixed for all measurements |
| Data acquisition rate | 0.61 seconds fastest, 1 to 2 seconds typical |
Contact Vvon Technologies Limited, Bangladesh's authorised distributor for J.A. Woollam.
Phone: +880 1711-738207 | Email: info@vvon.com.bd