Brand: J.A. Woollam | Category: Nanotechnology
The alpha 2.0 is the entry level benchtop spectroscopic ellipsometer for routine thickness and refractive index measurement. Place the sample, choose a model and press measure, and results follow in seconds. It suits single layer dielectrics, self assembled monolayers, organics and coatings on glass.
| Parameter | Value |
|---|---|
| Ellipsometer configuration | dual rotation optical design |
| Wavelength range | 400 to 1000 nm |
| Number of wavelengths | 190 |
| Angles of incidence | 65, 70, 75 degrees or 90 degrees straight through |
| Data acquisition rate | 5 to 10 seconds typical for the complete spectrum |
| Sample size | up to 200 mm diameter and 16 mm thick |
Contact Vvon Technologies Limited, Bangladesh's authorised distributor for J.A. Woollam.
Phone: +880 1711-738207 | Email: info@vvon.com.bd