Brand: J.A. Woollam | Category: Nanotechnology
The VASE is the established variable angle research ellipsometer, using a rotating analyser with the AutoRetarder and a custom scanning monochromator. A vertical sample mount supports reflection, transmission and scattering geometries on semiconductors, dielectrics, polymers, metals and multilayers.
| Parameter | Value |
|---|---|
| Ellipsometer configuration | rotating analyser ellipsometry with AutoRetarder and custom monochromator |
| Spectral range | 240 to 2500 nm standard, DUV extension adds 193 to 240 nm, 4IR extension adds 2500 to 4000 nm |
| Angles of incidence | fully automated, 15 to 90 degrees, accuracy 0.01 degrees |
| Data acquisition rate | 0.1 to 3 seconds per wavelength typical, 20 seconds per wavelength with full AutoRetarder |
| Maximum substrate thickness | 20 mm |
| Light source | 75 watt convection cooled xenon lamp |
Contact Vvon Technologies Limited about J.A. Woollam equipment requirements in Bangladesh.
Phone: +880 1711-738207 | Email: info@vvon.com.bd
The IR-VASE Mark II joins the chemical sensitivity of FTIR spectroscopy to spectroscopic ellipsometry across 1.7 to 30 microns. It gives n and k over the whole measured range without Kramers Kronig extrapolation, and needs no vacuum or reference sample, so liquid and solid interfaces can be studied.
The RC2 uses two synchronously rotating compensators and was the first commercial spectroscopic ellipsometer to collect all 16 elements of the Mueller matrix. That makes it suited to anisotropic materials, liquid crystals and nanostructures as well as ordinary thin film work.
The VUV-VASE measures from the vacuum ultraviolet to the near infrared and is used for optical characterisation of lithography thin films, high bandgap materials and immersion fluids. Placing the monochromator before the sample limits exposure of photosensitive materials during measurement.