Brand: J.A. Woollam | Category: Nanotechnology
The VASE is the established variable angle research ellipsometer, using a rotating analyser with the AutoRetarder and a custom scanning monochromator. A vertical sample mount supports reflection, transmission and scattering geometries on semiconductors, dielectrics, polymers, metals and multilayers.
| Parameter | Value |
|---|---|
| Ellipsometer configuration | rotating analyser ellipsometry with AutoRetarder and custom monochromator |
| Spectral range | 240 to 2500 nm standard, DUV extension adds 193 to 240 nm, 4IR extension adds 2500 to 4000 nm |
| Angles of incidence | fully automated, 15 to 90 degrees, accuracy 0.01 degrees |
| Data acquisition rate | 0.1 to 3 seconds per wavelength typical, 20 seconds per wavelength with full AutoRetarder |
| Maximum substrate thickness | 20 mm |
| Light source | 75 watt convection cooled xenon lamp |
Contact Vvon Technologies Limited, Bangladesh's authorised distributor for J.A. Woollam.
Phone: +880 1711-738207 | Email: info@vvon.com.bd