Brand: J.A. Woollam | Category: Nanotechnology
The T-Solar is a photovoltaic measurement system designed specifically for textured samples. It is based on the established M-2000 rotating compensator spectroscopic ellipsometer and measures hundreds of wavelengths across the UV, visible and near infra-red. To cope with rough, textured surfaces that greatly reduce the reflected signal, it pairs a special high-intensity lamp source with an Intensity-Optimizer that adjusts the light source automatically to the ideal range for the sample. An adjustable tilt-rotation stage aligns the pyramid structures of alkaline-etched monocrystalline surfaces, which makes the system well suited to characterising AR coatings on etched silicon.
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Contact Vvon Technologies Limited about J.A. Woollam equipment requirements in Bangladesh.
Phone: +880 1711-738207 | Email: info@vvon.com.bd
The alpha 2.0 is the entry level benchtop spectroscopic ellipsometer for routine thickness and refractive index measurement. Place the sample, choose a model and press measure, and results follow in seconds. It suits single layer dielectrics, self assembled monolayers, organics and coatings on glass.
The VUV-VASE measures from the vacuum ultraviolet to the near infrared and is used for optical characterisation of lithography thin films, high bandgap materials and immersion fluids. Placing the monochromator before the sample limits exposure of photosensitive materials during measurement.
The iSE is an in situ spectroscopic ellipsometer for real time monitoring of thin film deposition and etch. The source and receiver mount on the process chamber and measure through viewports, giving growth rate, thickness and optical constants with sub angstrom sensitivity for feedback control.