Brand: J.A. Woollam | Category: Nanotechnology
WVASE is J.A. Woollam's ellipsometric analysis programme, which the company describes as the most powerful and comprehensive available. Beyond ellipsometric data it also handles reflectance, transmission and neutron reflectivity data for thin film characterisation. Its generalised oscillator layer offers built in Lorentz, Gaussian, Harmonic, Drude, Tauc-Lorentz, Cody-Lorentz, Tanguy and PSEMI functions. The Meta-6 layer supports metamaterials with up to four constitutive functions, handles anisotropic structures requiring 3×3 tensors, and works with generalised ellipsometry and Mueller matrix ellipsometry measurements.
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Contact Vvon Technologies Limited about J.A. Woollam equipment requirements in Bangladesh.
Phone: +880 1711-738207 | Email: info@vvon.com.bd
MeasureLINK is Lake Shore's package for coordinating and automating characterisation systems. Experiments are assembled by dragging and dropping pre-written functional steps, so no programming knowledge is required, and the software sets the research platform environment while electrical measurements run. Data collection can be watched in real time, with time-stamped readings correlated to the measurement conditions, and custom scripting gives complete experimental control. Application packs extend it with instrument drivers, scripts, examples and documentation for Lake Shore and third party instruments.
CompleteEASE is J.A. Woollam's data acquisition and model development environment for ellipsometry, described by the company as the culmination of 35 years of ellipsometry experience and software development that began in the 1980s. It handles versatile measurements including automated sample mapping and spectroscopic ellipsometry, with recipe creation for automated collection and analysis and a scan pattern editor working in cartesian or polar coordinates. Modelling tools include a thickness pre-fit algorithm, standard grid and randomised global fitting, an alternate models test covering surface roughness, grading and anisotropy, a B-Spline layer for semi-absorbing materials and a General Oscillator (Gen-Osc) layer, with regression by an optimised Levenberg-Marquardt routine that works with multi-core processors. Pattern recognition and deskew, Mueller matrix measurement and decomposition, and in-situ real time monitoring with a multi-time-slice analysis mode are also provided.
Acquisition is the measuring module of the Linseis L42 thermal analysis suite, and Linseis supply a matching measurement programme for every type of measuring device. It runs the measurement itself, taking care of temperature control, the recording of all relevant data and additional parameters such as force and position, and it can drive external devices including pressure regulators, mass flow controllers and vacuum pumps. For more complex applications the results are written to the database that all Linseis programmes share, while simpler procedures produce PDF or text reports. Measurement templates and device calibration are handled here as well.