Skip to main content

WVASE Software

Brand: J.A. Woollam | Category: Nanotechnology

WVASE is J.A. Woollam's ellipsometric analysis programme, which the company describes as the most powerful and comprehensive available. Beyond ellipsometric data it also handles reflectance, transmission and neutron reflectivity data for thin film characterisation. Its generalised oscillator layer offers built in Lorentz, Gaussian, Harmonic, Drude, Tauc-Lorentz, Cody-Lorentz, Tanguy and PSEMI functions. The Meta-6 layer supports metamaterials with up to four constitutive functions, handles anisotropic structures requiring 3×3 tensors, and works with generalised ellipsometry and Mueller matrix ellipsometry measurements.

View on manufacturer website

Get a Quote

Contact Vvon Technologies Limited, Bangladesh's authorised distributor for J.A. Woollam.

Phone: +880 1711-738207 | Email: info@vvon.com.bd

Back to Nanotechnology