Brand: J.A. Woollam | Category: Nanotechnology
CompleteEASE is J.A. Woollam's data acquisition and model development environment for ellipsometry, described by the company as the culmination of 35 years of ellipsometry experience and software development that began in the 1980s. It handles versatile measurements including automated sample mapping and spectroscopic ellipsometry, with recipe creation for automated collection and analysis and a scan pattern editor working in cartesian or polar coordinates. Modelling tools include a thickness pre-fit algorithm, standard grid and randomised global fitting, an alternate models test covering surface roughness, grading and anisotropy, a B-Spline layer for semi-absorbing materials and a General Oscillator (Gen-Osc) layer, with regression by an optimised Levenberg-Marquardt routine that works with multi-core processors. Pattern recognition and deskew, Mueller matrix measurement and decomposition, and in-situ real time monitoring with a multi-time-slice analysis mode are also provided.
Contact Vvon Technologies Limited, Bangladesh's authorised distributor for J.A. Woollam.
Phone: +880 1711-738207 | Email: info@vvon.com.bd