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RC2 Ellipsometer

Brand: J.A. Woollam | Category: Nanotechnology

The RC2 uses two synchronously rotating compensators and was the first commercial spectroscopic ellipsometer to collect all 16 elements of the Mueller matrix. That makes it suited to anisotropic materials, liquid crystals and nanostructures as well as ordinary thin film work.

Technical Specifications

ParameterValue
Ellipsometer configurationdual rotating compensator (dual RCE)
Wavelength range193 to 1000 nm in the D configuration, XNIR option adds 1005 to 2500 nm
Number of wavelengthsabout 800 in the D configuration
Angles of incidence45 to 90 degrees automated angle base, 20 to 90 degrees vertical automated angle base
Data acquisition rate0.3 seconds minimum, 2 to 10 seconds typical for the complete spectrum
Maximum substrate thickness18 mm

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Get a Quote

Contact Vvon Technologies Limited, Bangladesh's authorised distributor for J.A. Woollam.

Phone: +880 1711-738207 | Email: info@vvon.com.bd

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