Brand: Nanosurf | Category: Nanotechnology
An industrial AFM built around the Flex-Mount tip-scanning head for samples that are too large or too heavy for a normal microscope. A dedicated acoustic enclosure cuts external noise, and extra translation or rotation axes can be added for awkward geometries.
| Parameter | Value |
|---|---|
| Sample size | up to 300 mm x 300 mm |
| Sample weight | up to 45 kg |
| Scan range | 100 um |
| Z approach stage | 50 mm travel |
| Controller | 24-bit CX controller |
| Sample observation | top and side view camera |
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Contact Vvon Technologies Limited about Nanosurf equipment requirements in Bangladesh.
Phone: +880 1711-738207 | Email: info@vvon.com.bd
An AFM metrology system for 300 mm wafers, aimed at Angstrom level surface roughness and dimensional measurement in semiconductor quality control. WaveMode photothermal off-resonance imaging raises the line rate while holding tip sharpness, and wafer edge and sidewall inspection is supported.
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