Brand: Jandel Engineering | Category: Nanotechnology
The Hand Applied Probe rests directly on the sample rather than being held above it, which avoids the reading drift seen with fully handheld methods. It measures thin layers, wafers and large ingots, but the strong downward force rules out fragile unsupported samples.
| Parameter | Value |
|---|---|
| Specification | Probe head loads up to 200 g per needle |
| Specification | Downward force of around 1.2 kg to compress the needles fully |
| Specification | Measures thin layers and wafers up to large ingots |
| Specification | Not suitable for fragile unsupported samples |
Contact Vvon Technologies Limited, Bangladesh's authorised distributor for Jandel Engineering.
Phone: +880 1711-738207 | Email: info@vvon.com.bd