Brand: Jandel Engineering | Category: Nanotechnology
The Multiheight Probe Stand raises and lowers the probe mechanism so samples from thin films to large ingots can be measured on one stand. It is Jandel's most popular stand and its base carries four mounting holes for accessories such as an eight inch wafer table.
| Parameter | Value |
|---|---|
| Specification | Probe mechanism can be raised and lowered for thin films through to large ingots |
| Specification | Measures samples up to 10 in deep |
| Specification | Sample width limited only by the need to support the ends |
| Specification | Four mounting holes in the base for optional accessories |
| Specification | Lever operated probe with switched current leads to prevent sparking |
Contact Vvon Technologies Limited about Jandel Engineering equipment requirements in Bangladesh.
Phone: +880 1711-738207 | Email: info@vvon.com.bd
This version of the Multiheight stand adds a micrometer controlled X-Y stage for small samples. Four screws release the stage, so the same stand returns to handling large wafers and ingots without further adjustment.
The HM21 is Jandel's compact four point probe test unit with six switched constant current settings. It is the unit paired with the Hand Applied Probe in the Portable Probing System, so measurements can be made away from the laboratory bench.
The Multiposition Probe Stand is built for wafer measurement, with indexed rotation and linear travel that return the probe to the same points run after run. Two sizes are offered at the same cost, the smaller one being easier for placing small wafers on the table.