Brand: Hitachi High-Tech | Category: Nanotechnology
The Hitachi SU3500 is an earlier-model scanning electron microscope with high-vacuum and variable-pressure imaging modes. Its manufacturer brochure describes several stage and detector options, so the installed configuration matters when assessing sample suitability or requesting support. This page retains the SU3500 model reference; current instrument, spare-part and support availability must be confirmed. For a new microscope purchase, compare the separately catalogued SU3800/SU3900 family against your sample and analysis requirements.
Plan your next step
Distinguish an enquiry about an installed SU3500 from a new SEM purchase. Hitachi’s SU3500 brochure is useful reference material; current availability and supported configurations need confirmation.
Explore SU3800/SU3900: Review a currently catalogued variable-pressure SEM family.
Microscopy and microanalysis catalogue: Browse instruments, detectors and preparation equipment.
Hitachi SU3500 brochure: Consult the manufacturer’s reference specification.
| Parameter | Value |
|---|---|
| Accelerating voltage (reference brochure) | 0.3–30 kV |
| Variable pressure range (reference brochure) | 6–650 Pa |
| Stage options (reference brochure) | 4-axis or 5-axis motorised configuration |
| Current availability | Instrument, spare-part and support availability to be confirmed |
Contact Vvon Technologies Limited about Hitachi High-Tech equipment requirements in Bangladesh.
Phone: +880 1711-738207 | Email: info@vvon.com.bd
Ultim Max Infinity is the Oxford Instruments silicon drift detector range for energy dispersive X-ray analysis in the SEM. Sensor sizes from 40 to 170 square millimetres all give the same analytical performance, with a motorised slide for insertion and retraction.
The SU3800 and SU3900 are variable pressure scanning electron microscopes with a five axis motorised stage and automated functions. The SU3900 carries a larger multipurpose chamber that takes specimens up to 300 mm diameter for bulky industrial samples.
The FlexSEM 1000 II is a variable pressure scanning electron microscope with a tungsten filament source. It images uncoated and outgassing samples in a controlled pressure chamber, and supports energy dispersive X-ray analysis and STEM specimen holders.