Brand: Honeywell | Category: Nanotechnology
Chemcassette monitoring system covering eight to 24 points of continuous gas detection, with built in redundancy to protect against downtime. Sampling points can be added as monitoring needs change without replacing the cabinet.
| Parameter | Value |
|---|---|
| Power requirement | 110/230 V AC |
| Operating voltage | 110 or 230 V AC ± 10% (Under Load) @50/60 Hz; 15A |
| Display type | 1024 x 768 pixel Touch Screen with at-a-Glance System Status |
| Size | H: 56 in D: 36 in W: 24 in |
Contact Vvon Technologies Limited about Honeywell equipment requirements in Bangladesh.
Phone: +880 1711-738207 | Email: info@vvon.com.bd
Now in its ninth generation, this nanomanipulator applies piezo actuation to nanoscale positioning in the FIB and SEM, offering four degrees of freedom in X, Y, Z and R with 4 mm or more of working distance. Nanometre-resolution piezo actuators paired with 10 nm closed-loop encoders deliver precision, linearity and smooth motion, and closed loop control lets the operator navigate to stored positions and move orthogonally at any sample tilt. Motorised concentric rotation and in situ tip changes come as standard, so probe needles can be swapped in under 3 minutes without venting the microscope. Insertion and retraction are non-pneumatic, which is gentle on fragile samples.
Continuous Chemcassette monitoring system scaling to 72 points of gas detection. Analysers, optics and software are combined in one cabinet so a fab can start small and add points as the monitoring requirement grows.
Ultim Max TLE is the Oxford Instruments flagship silicon drift detector for the TEM, optimised for elemental characterisation at the atomic scale with maximum count rates at the smallest probe sizes. Its performance comes from an optimised sensor shape, a 100 mm2 sensor, windowless construction, an optimised mechanical design and Extreme electronics. The detector is also aimed at biological sample analysis, where it collects data quickly and accurately on beam sensitive samples by maximising the count rate of low energy X-rays. Extreme electronics combined with the X4 pulse processor allow in situ EDS mapping and quantification at elevated temperatures.