Brand: Denton Vacuum | Category: Nanotechnology
An optical monitoring system that measures the optical thickness of a coating while it is being deposited, using reflection from or transmission through a substrate or witness chip. The deposition is then stopped at the target optical thickness rather than at a physical thickness.
| Parameter | Value |
|---|---|
| Wavelength range | configurable between 400 and 2200 nanometres |
| Chip changer | automated and programmable, holds 50 chips with receiver for spent chips |
| Modes | works in both reflection and transmission |
| Specification | Crystal sensor at the chip changer supports real-time monitor-to-work relationships |
| Specification | Runs in a Windows environment with calculations performed by LabVIEW |
| Specification | Integrated with the Denton Integrity control system |
Contact Vvon Technologies Limited, Bangladesh's authorised distributor for Denton Vacuum.
Phone: +880 1711-738207 | Email: info@vvon.com.bd