Brand: Linseis | Category: Nanotechnology
The HCS L36 is a Hall effect measuring system. It determines charge carrier mobility, specific resistance, charge carrier concentration and the Hall constant of a sample. Plug-and-play sample holders take pieces up to 12.5 x 12.5 mm2 for electrical characterisation of semiconductors.
| Parameter | Value |
|---|---|
| Sample size | up to 12.5 x 12.5 mm2 with plug-and-play sample holders |
Not sure which configuration you need? Help me choose
Contact Vvon Technologies Limited about Linseis equipment requirements in Bangladesh.
Phone: +880 1711-738207 | Email: info@vvon.com.bd
The TFA L59 is a thin film analyser for layers in the nanometre to micrometre range. Using pre-structured measuring chips it determines thermal conductivity by the 3 Omega method along with heat capacity, and optionally electrical conductivity and Hall data. It works from -160 C to 280 C.
The LSR L31, formerly the LSR-1, characterises thermoelectric materials as bulk samples and thin films. It measures the Seebeck coefficient and the specific electrical resistance, with a cryo option down to -160 C. The sample sits on an integrated PCB board with two heaters.
The TEG L34, also published as the TEG-Tester, rates the temperature dependent efficiency of thermoelectric generators and Peltier elements. A controlled temperature difference is applied across the module and the resulting voltage and current are recorded. It takes round and rectangular modules up to 25 mm thick.