Brand: Hitachi | Category: Scientific & Laboratory
The Hitachi SU3500 is a premium variable-pressure scanning electron microscope (VP-SEM) designed to deliver high-resolution imaging across the full range of sample types — from conductive metals to uncoated biological specimens, ceramics, polymers and paper — without the need for conductive coating. Its newly designed low-aberration objective lens and hex bias technology achieve 7 nm SE resolution at 3 kV and 10 nm BSE resolution at 5 kV. The large specimen chamber accommodates samples up to 200 mm diameter, 80 mm height and 8 kg weight, with a 5-axis eucentric motorised stage. Variable pressure mode (6–650 Pa) enables imaging of hydrated, outgassing and non-conductive samples. An optional Bruker XFlash EDX detector adds elemental composition analysis. The SU3500 is the workhorse SEM for university analytical facilities, materials research laboratories and quality control departments.
| Parameter | Value |
|---|---|
| SE resolution (high vacuum) | 7 nm @ 3 kV |
| BSE resolution (high vacuum) | 10 nm @ 5 kV |
| Accelerating voltage | 0.3–30 kV |
| Variable pressure range | 6–650 Pa |
| Magnification | 5× to 300,000× |
| Stage type | 5-axis eucentric motorised (X, Y, Z, tilt, rotation) |
| Stage rotation | 360° |
| Stage tilt | −20° to +90° |
| Max specimen diameter | 200 mm |
| Max specimen height | 80 mm |
| Max specimen weight | 8 kg |
| Observation area (with rotation) | 130 mm diameter |
| Electron source | Tungsten thermionic filament |
| EDX option | Bruker XFlash 6-10 (123 eV resolution at Mn Kα) |
Contact Vvon Technologies Limited — Bangladesh's authorised distributor for Hitachi.
Phone: +880 1711-738207 | Email: info@vvon.com.bd